Particle-induced X-ray emission: thick-target analysis of inorganic materials in the determination of light elements

1994 ◽  
Vol 9 (3) ◽  
pp. 311-314 ◽  
Author(s):  
J. Pérez-Arantegui ◽  
G. Querré ◽  
J. R. Castillo
Keyword(s):  
Thick Target ◽  
Inorganic Materials ◽  
Light Elements ◽  
X Ray ◽  
Target Analysis

Evaluation of a Demountable X-Ray Tube Vacuum Spectrograph for the Determination of Low-Atomic-Number Elements

1963 ◽  
Vol 7 ◽  
pp. 512-522
Author(s):  
John W. Thatcher ◽  
William J. Campbell
Keyword(s):  
Atomic Number ◽  
Electron Excitation ◽  
Light Elements ◽  
Target Element ◽  
X Ray ◽  
Long Wavelength

AbstractThe fluorescent excitation of long-wavelength X-ray spectra is reviewed with respect to X-ray tube target element, inherent filtration, and optimum kilovoltage. A demountable X-ray tube vacuum spectrograph designed for the determination of the light elements is described. Operation of this instrument with both secondary and combined primary—secondary excitation is evaluated. Examples from the literature are cited to show the feasibility of direct electron excitation of longwavelength spectra.

Determination of Light Elements on the Chem-X Multichannel Spectrometer

1982 ◽  
Vol 26 ◽  
pp. 437-442
Author(s):  
Y.M. Gurvich ◽  
A. Buman ◽  
I. Lokshin
Keyword(s):  
Optical Path ◽  
Vacuum System ◽  
X Rays ◽  
Light Elements ◽  
X Ray ◽  
Fluorescence Determination ◽  
Detector Window ◽  
Sample Presentation ◽  
Multichannel Spectrometer

For X-ray fluorescence determination of light elements, vacuum X-rays spectrometers are usually used to increase the transmission of the optical path for the soft X-radiation. A vacuum of about 50μHg is required for the determination of elements with atomic numbers down to 9(F).A vacuum system however, complicates the sample presentation mechanism of a spectrometer; it requires vacuum seals, additional fastening of the flow detector window and, as a results, increases the price of the spectrometer.

The determination of light elements by proton excitation and x-ray spectrometry

1969 ◽  
Vol 46 (1) ◽  
pp. 107-112 ◽  
Author(s):  
H. Kamada ◽  
R. Inoue ◽  
M. Terasawa ◽  
Y. Gohshi ◽  
H. Kamei ◽  
...  
Keyword(s):  
Light Elements ◽  
X Ray

MICRO-PIXE STUDIES OF MINERALIZED TISSUES – A QUANTITATIVE APPROACH

1994 ◽  
Vol 04 (01) ◽  
pp. 37-47 ◽  
Author(s):  
E. ROKITA ◽  
A. WROBEL ◽  
F. MUNNIK ◽  
P.H.A. MUSTSAERS ◽  
M.J.A. de VOIGT
Keyword(s):  
Quantitative Analysis ◽  
Systematic Errors ◽  
Thick Target ◽  
Sample Thickness ◽  
Matrix Composition ◽  
X Ray ◽  
Sample Matrix ◽  
Simultaneous Measurements ◽  
Mineralized Tissues

A method of quantitative analysis of bone samples by simultaneous measurements of proton induced X-ray emission (PIXE) and Rutherford backscattered (RBS) spectra is described. The method is used for the evaluation of the data collected during proton microprobe irradiation. The RBS spectra are used for the determination of the sample thickness. The sample matrix is regarded as a mixture of collagen and hydroxyapatite. The unknown proportion of both compounds at each irradiated point is adjusted until the Ca concentration determined by PIXE is in accordance with the value calculated on the basis of the assumed matrix composition. For quantitative analysis, the calculation of the absolute yield using the thick target PIXE formula was applied. The sources and ranges of systematic errors are discussed.

The Application of Electron Energy Loss Spectroscopy in Glass - Ceramic Microstructural Analysis

1977 ◽  
Vol 35 ◽  
pp. 250-251
Author(s):  
R. M. Anderson ◽  
A. Kumar
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Microstructural Analysis ◽  
Elemental Content ◽  
Light Elements ◽  
X Ray ◽  
Electron Energy Loss Spectrometry ◽  
C And N ◽  
Electron Energy Loss

The identification of unknown phases in crystallized glasses or ceramics has been difficult because the phases are generally composed of many elements; they crystallize into low-symmetry lattices; they contain numerous impurities, which may alter crystal structure or allow the observation of metastable phases; and they are not well represented in standard compilations of crystal data. Compounding the problem is the fact that energy- dispersive x-ray analysis (EDX) for elemental content can not be employed for elements with Z<11. This eliminates any possibility of qualitative analysis of the important Li, Be, and B glasses as well as determination of O, C and N content. Electron Energy Loss Spectrometry (ELS) has been shown to be a powerful method for the analysis of light elements. The ELS method is far more efficient at detecting light elements than x-ray detection, because the yield of energy loss electrons to inner shell excitation and ionizations is unity and because the electrons, which have lost energy encountering the sample, are scattered through very small angles, with the result that collection efficiencies are high.

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