AbstractFF-GDMS and MIC-ICP-MS methods were developed for the determination of mg/kg- and μg/kg-level B, Mg, Al, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Mo, Sb, W and Pb in nuclear-grade graphite. Consistent results have been achieved in determining trace elements like B, Ti, Cr, Mn, Zr, Sb and Pb by both methods, which vary mostly less than ±30%, and are in line with the manufacturer reference values. On Mg, Al, Fe, Co, Zn, Mo and W, FF-GDMS analyses also show good agreement with the manufacturer's data. Continuing efforts in identifying source of interference, which has limited the MIC-ICP-MS analysis of these elements, is currently underway.