Microwave absorption. The use of microwaves in the study of ionic and chemical equilibria at high temperatures

1955 ◽  
Vol 19 ◽  
pp. 68 ◽  
Author(s):  
T. M. Sugden
2018 ◽  
Vol 778 ◽  
pp. 200-205
Author(s):  
Muhammad Salman ◽  
Anwaar Ellahi ◽  
Syed Wilayat Hussain

A method of adding RAM directly in silica phenolic composite was tested. Due to direct incorporation of RAM, the resultant composite not only can show microwave absorption at normal conditions but can sustain this capability at high heat fluxes. Such RAM added composite becomes more applicable for materials which are exposed to high temperatures. Two different RAM added silica fibre phenolic composites were developed and their RF-absorptions were compared with pure silica fibre phenolic sample. It was found that depending on the type of RAM their RF-absorption can be enhanced. Strength and ablation properties of the resultant composites were also found to alter with the addition of RAM in the composite.


AIP Advances ◽  
2016 ◽  
Vol 6 (6) ◽  
pp. 065001 ◽  
Author(s):  
K. Kashimura ◽  
H. Sugawara ◽  
M. Hayashi ◽  
T. Mitani ◽  
N. Shinohara

Author(s):  
Z. L. Wang ◽  
J. Bentley

Studying the behavior of surfaces at high temperatures is of great importance for understanding the properties of ceramics and associated surface-gas reactions. Atomic processes occurring on bulk crystal surfaces at high temperatures can be recorded by reflection electron microscopy (REM) in a conventional transmission electron microscope (TEM) with relatively high resolution, because REM is especially sensitive to atomic-height steps.Improved REM image resolution with a FEG: Cleaved surfaces of a-alumina (012) exhibit atomic flatness with steps of height about 5 Å, determined by reference to a screw (or near screw) dislocation with a presumed Burgers vector of b = (1/3)<012> (see Fig. 1). Steps of heights less than about 0.8 Å can be clearly resolved only with a field emission gun (FEG) (Fig. 2). The small steps are formed by the surface oscillating between the closely packed O and Al stacking layers. The bands of dark contrast (Fig. 2b) are the result of beam radiation damage to surface areas initially terminated with O ions.


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