Glancing angle XAFS and X-ray reflectivity studies of transition-metal/aluminium interfaces

1990 ◽  
Vol 89 ◽  
pp. 21 ◽  
Author(s):  
Steve M. Heald ◽  
Enrique V. Barrera ◽  
Huaiyu Chen
Keyword(s):  
Transition Metal ◽  
X Ray ◽  
Glancing Angle ◽  
Metal Aluminium

X-Ray Spectra and Electronic Structure of Some CsCl-Type Transition Metal-Aluminium Alloys

1979 ◽  
Vol 93 (2) ◽  
pp. 713-720 ◽  
Author(s):  
W. Blau ◽  
J. Weisbach ◽  
G. Merz ◽  
K. Kleinstück
Keyword(s):  
Electronic Structure ◽  
Transition Metal ◽  
Aluminium Alloys ◽  
X Ray ◽  
Type Transition ◽  
Cscl Type ◽  
Metal Aluminium

Preparation, properties and structure of some intermediate nido- and arachno-monocarbaboranes

1981 ◽  
Vol 46 (10) ◽  
pp. 2345-2353 ◽  
Author(s):  
Karel Baše ◽  
Bohumil Štíbr ◽  
Jiří Dolanský ◽  
Josef Duben
Keyword(s):  
Transition Metal ◽  
Metal Complexes ◽  
Transition Metal Complexes ◽  
Nmr Spectra ◽  
Liquid Ammonia ◽  
X Ray Diffraction ◽  
X Ray ◽  
H Nmr ◽  
Starting Compound

The 6-N(CH3)3-6-CB9H11 carbaborane reacts with sodium in liquid ammonia with the formation of 6-CB9H12- which was used as a starting compound for preparing the 4-CB8H14, 9-L-6-CB9H13 (L = (CH3)2S, CH3CN and P(C6H5)3), 1-(η5-C5H5)-1,2-FeCB9H10-, and 2,3-(η5-C5H5)2-2,31-Co2CB9H10- carboranes. The 4-CB8H14 compound was dehydrogenated at 623 K to give 4-(7)-CB8H12 carborane. Base degradation of 6-N(CH3)3-6-CB9H11 in methanol resulted in the formation of 3,4-μ-N(CH3)3CH-B5H10. The structure of all compounds was proposed on the basis of their 11B and 1H NMR spectra and X-ray diffraction was used in the case of the transition metal complexes.

Regiospezifische Insertion von [SCN]- und [SeCN]- in die S – C- bzw. Se– C-Bindung Übergangsmetall-koordinierter Thietane und SelenetaneRegiospecific Insertion of [SCN]- and [SeCN]- in the S–C- and Se–C-Bond of Transition-Metal-Coordinated Thietanes and Selenetanes

1993 ◽  
Vol 48 (11) ◽  
pp. 1613-1620 ◽  
Author(s):  
Helmut Fischer ◽  
Claudia Kalbas ◽  
Carsten Troll ◽  
Klaus H. Fluck
Keyword(s):  
Nitrogen Atom ◽  
Transition Metal ◽  
Structure Analysis ◽  
Trans Isomer ◽  
X Ray ◽  
Tungsten Complexes ◽  
Membered Heterocycle

Pentacarbonyl(thietane)tungsten complexes react with thiocyanate, [SCN]-, and SiO2/H2O by insertion of the CN group into a S—C bond of the four-membered heterocycle, 1,3-migration of the pentacarbonyltungsten fragment and protonation of the nitrogen atom to give tungsten-coordinated thiazinthione complexes. Analogously, the reactions of a thietane tungsten complex with [SeCN]- and SiO2/H2O affords a thiazinselone complex. A selenazinthione complex is obtained from a selenetane complex and [SCN]- (+ SiO2/H2O). The insertions are regiospecific and stereoselective. The structure of the trans-isomer of a pentacarbonyl-(thiazinthione) complex has been established by X-ray structure analysis.

X-RAY ABSORPTION EDGES OF TRANSITION- METAL-DOPED Y1Ba2Cu3−xMxO7−∂

1988 ◽  
Vol 02 (05) ◽  
pp. 1153-1156 ◽  
Author(s):  
J. B. BOYCE ◽  
F. BRIDGES ◽  
T. CLAESON ◽  
T. H. GEBALLE ◽  
M. NYGREN ◽  
...  
Keyword(s):  
Transition Metal ◽  
X Ray ◽  
Metal Doped ◽  
X Ray Absorption ◽  
Absorption Edges

Quantitative Study of Al/W Interaction In Si/SiO2/W-Ti/Al Thin Film System

1988 ◽  
Vol 119 ◽  
Author(s):  
Hung-Yu Liu ◽  
Peng-Heng Chang ◽  
Jim Bohlman ◽  
Hun-Lian Tsai
Keyword(s):  
Thin Film ◽  
Film System ◽  
X Ray Diffraction ◽  
Compound Formation ◽  
X Ray ◽  
Thin Film System ◽  
Glancing Angle ◽  
Integrated Intensity ◽  
Al Thin Film ◽  
Kinetics Of

AbstractThe interaction of Al and W in the Si/SiO2/W-Ti/Al thin film system is studied quantitatively by glancing angle x-ray diffraction. The formation of Al-W compounds due to annealing is monitored by the variation of the integrated intensity from a few x-ray diffraction peaks of the corresponding compounds. The annealing was conducted at 400°C, 450°C and 500°C from 1 hour to 300 hours. The kinetics of compound formation is determined using x-ray diffraction data and verified by TEM observations. We will also show the correlation of the compound formation to the change of the electrical properties of these films.

Sign in / Sign up

Export Citation Format

Share Document