scholarly journals In situ nanoscale evaluation of pressure-induced changes in structural morphology of phosphonium phosphate ionic liquid at single-asperity contacts

RSC Advances ◽  
2022 ◽  
Vol 12 (1) ◽  
pp. 413-419
Author(s):  
Zixuan Li ◽  
Oscar Morales-Collazo ◽  
Robert Chrostowski ◽  
Joan F. Brennecke ◽  
Filippo Mangolini
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Applied Pressure ◽  
Structural Morphology ◽  
Force Microscopy ◽  
Single Asperity ◽  
Atomic Force ◽  
Asperity Contacts ◽  
Induced Changes

In this work, we perform atomic force microscopy (AFM) experiments to evaluate in situ the dependence of the structural morphology of trihexyltetradecylphosphonium bis(2-ethylhexyl) phosphate ([P6,6,6,14][DEHP]) ionic liquid (IL) on applied pressure.

scholarly journals Ion structure controls ionic liquid near-surface and interfacial nanostructure

2015 ◽  
Vol 6 (1) ◽  
pp. 527-536 ◽  
Author(s):  
Aaron Elbourne ◽  
Kislon Voïtchovsky ◽  
Gregory G. Warr ◽  
Rob Atkin
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Near Surface ◽  
3 Dimensional ◽  
Force Microscopy ◽  
Ion Structure ◽  
Atomic Force

In situ amplitude modulated atomic force microscopy (AM-AFM) has been used to resolve the 3-dimensional nanostructure of five protic ILs at and near the surface of mica.

scholarly journals Effect of water on the electroresponsive structuring and friction in dilute and concentrated ionic liquid lubricant mixtures

2020 ◽  
Vol 22 (48) ◽  
pp. 28191-28201
Author(s):  
Georgia A. Pilkington ◽  
Rebecca Welbourn ◽  
Anna Oleshkevych ◽  
Seiya Watanabe ◽  
Patricia Pedraz ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Neutron Reflectivity ◽  
Force Microscopy ◽  
Liquid Lubricant ◽  
Effect Of Water ◽  
Atomic Force ◽  
Ambient Levels

The influence of ambient levels of water on the electroresponsive interfacial structuring and nanofriction of ionic liquid lubricant mixtures has been investigated by neutron reflectivity and atomic force microscopy.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force
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