scholarly journals X-ray excited luminescence spectroscopy and imaging with NaGdF4:Eu and Tb

RSC Advances ◽  
2021 ◽  
Vol 11 (50) ◽  
pp. 31717-31726
Author(s):  
Meenakshi Ranasinghe ◽  
Md. Arifuzzaman ◽  
Apeksha C. Rajamanthrilage ◽  
W. R. Willoughby ◽  
Ashley Dickey ◽  
...  
Keyword(s):  
High Resolution ◽  
Light Intensity ◽  
Visible Light ◽  
Luminescence Spectroscopy ◽  
Beam Position ◽  
X Ray ◽  
High Resolution Images ◽  
Excited Luminescence

We synthesized and characterized Eu and Tb doped NaGdF4 nanophosphors which generate visible light when excited by a focused X-ray beam. High resolution images were acquired through tissue by measuring light intensity vs. X-ray beam position.

Spatio-temporal measurement of beam properties in the PLS diagnostic beamline

1998 ◽  
Vol 5 (3) ◽  
pp. 642-644 ◽  
Author(s):  
J. Y. Huang ◽  
I. S. Ko
Keyword(s):  
Visible Light ◽  
Imaging System ◽  
Ccd Camera ◽  
Photon Beam ◽  
Transverse Beam ◽  
Beam Position ◽  
X Ray ◽  
X Ray Imaging ◽  
Visible Light Imaging ◽  
Temporal Measurement

A diagnostic beamline is being constructed in the PLS storage ring for measurement of electron- and photon-beam properties. It consists of two 1:1 imaging systems: a visible-light imaging system and a soft X-ray imaging system. In the visible-light imaging system, the transverse beam size and beam position are measured with various detectors: a CCD camera, two photodiode arrays and a photon-beam position monitor. Longitudinal bunch structure is also investigated with a fast photodiode detector and a picosecond streak camera. On the other hand, the soft X-ray imaging system is under construction to measure beam sizes with negligible diffraction-limited error. The X-ray image optics consist of a flat cooled mirror and two spherical focusing mirrors.

scholarly journals Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry

2016 ◽  
Vol 23 (6) ◽  
pp. 1462-1473 ◽  
Author(s):  
Sebastian Cartier ◽  
Matias Kagias ◽  
Anna Bergamaschi ◽  
Zhentian Wang ◽  
Roberto Dinapoli ◽  
...  
Keyword(s):  
High Resolution ◽  
Silicon Detector ◽  
Limiting Factor ◽  
X Rays ◽  
X Ray ◽  
Charge Cloud ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Hybrid Silicon ◽  
Small Pixel

MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor,e.g.inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 µm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.

scholarly journals The Effect of Image Resolution on Automated Classification of Chest X-rays

2021 ◽  
Author(s):  
Md Inzamam Ul Haque ◽  
Abhishek K Dubey ◽  
Jacob D Hinkle
Keyword(s):  
High Resolution ◽  
Automated Analysis ◽  
Image Resolution ◽  
Free Text ◽  
X Rays ◽  
Training Time ◽  
X Ray ◽  
Radiology Reports ◽  
Chest X Ray ◽  
High Resolution Images

Deep learning models have received much attention lately for their ability to achieve expert-level performance on the accurate automated analysis of chest X-rays. Although publicly available chest X-ray datasets include high resolution images, most models are trained on reduced size images due to limitations on GPU memory and training time. As compute capability continues to advance, it will become feasible to train large convolutional neural networks on high-resolution images. This study is based on the publicly available MIMIC-CXR-JPG dataset, comprising 377,110 high resolution chest X-ray images, and provided with 14 labels to the corresponding free-text radiology reports. We find, interestingly, that tasks that require a large receptive field are better suited to downscaled input images, and we verify this qualitatively by inspecting effective receptive fields and class activation maps of trained models. Finally, we show that stacking an ensemble across resolutions outperforms each individual learner at all input resolutions while providing interpretable scale weights, suggesting that multi-scale features are crucially important to information extraction from high-resolution chest X-rays.

Three Dimensional X-Ray Computed Tomography in Materials Science

MRS Bulletin ◽  
1988 ◽  
Vol 13 (1) ◽  
pp. 13-18 ◽  
Author(s):  
J.H. Kinney ◽  
Q.C. Johnson ◽  
U. Bonse ◽  
M.C. Nichols ◽  
R.A. Saroyan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Sample Preparation ◽  
Visible Light ◽  
Three Dimensional ◽  
Materials Characterization ◽  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging ◽  
Visible Light Imaging

Imaging is the cornerstone of materials characterization. Until the middle of the present century, visible light imaging provided much of the information about materials. Though visible light imaging still plays an extremely important role in characterization, relatively low spatial resolution and lack of chemical sensitivity and specificity limit its usefulness.The discovery of x-rays and electrons led to a major advance in imaging technology. X-ray diffraction and electron microscopy allowed us to characterize the atomic structure of materials. Many materials vital to our high technology economy and defense owe their existence to the understanding of materials structure brought about with these high-resolution methods.Electron microscopy is an essential tool for materials characterization. Unfortunately, electron imaging is always destructive due to the sample preparation that must be done prior to imaging. Furthermore, electron microscopy only provides information about the surface of a sample. Three dimensional information, of great interest in characterizing many new materials, can be obtained only by time consuming sectioning of an object.The development of intense synchrotron light sources in addition to the improvements in solid state imaging technology is revolutionizing materials characterization. High resolution x-ray imaging is a potentially valuable tool for materials characterization. The large depth of x-ray penetration, as well as the sensitivity of absorption crosssections to atomic chemistry, allows x-ray imaging to characterize the chemistry of internal structures in macroscopic objects with little sample preparation. X-ray imaging complements other imaging modalities, such as electron microscopy, in that it can be performed nondestructively on metals and insulators alike.

The crystal structure of visible light absorbing piezoelectric semiconductor SrNb2V2O11 revisited: high-resolution X-ray diffraction, vibrational spectroscopy and computational study

2019 ◽  
Vol 7 (18) ◽  
pp. 5497-5505
Author(s):  
Ievgen V. Odynets ◽  
Sergiy Khainakov ◽  
Santiago Garcia-Granda ◽  
Roman Gumeniuk ◽  
Matthias Zschornak ◽  
...  
Keyword(s):  
Crystal Structure ◽  
High Resolution ◽  
Visible Light ◽  
Crystal Lattice ◽  
Vibrational Spectroscopy ◽  
Computational Study ◽  
X Ray Diffraction ◽  
Piezoelectric Semiconductor ◽  
X Ray

The crystal lattice of piezoelectric semiconductor Sr2Nb2V2O11 adopts Cc ordering due to Γ2− mode distortion.

Atomic structure of YB56 studied by digital high-resolution electron microscopy and electron diffraction

2001 ◽  
Vol 16 (1) ◽  
pp. 101-107 ◽  
Author(s):  
Takeo Oku ◽  
Jan-Olov Bovin ◽  
Iwami Higashi ◽  
Takaho Tanaka ◽  
Yoshio Ishizawa
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
High Resolution Electron Microscopy ◽  
Charge Coupled Device ◽  
X Ray ◽  
Resolution Electron ◽  
High Resolution Images ◽  
Diffraction Patterns ◽  
Simulated Images

Atomic positions for Y atoms were determined by using high-resolution electron microscopy and electron diffraction. A slow-scan charge-coupled device camera which had high linearity and electron sensitivity was used to record high-resolution images and electron diffraction patterns digitally. Crystallographic image processing was applied for image analysis, which provided more accurate, averaged Y atom positions. In addition, atomic disordering positions in YB56 were detected from the differential images between observed and simulated images based on x-ray data, which were B24 clusters around the Y-holes. The present work indicates that the structure analysis combined with digital high-resolution electron microscopy, electron diffraction, and differential images is useful for the evaluation of atomic positions and disordering in the boron-based crystals.

High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube

1998 ◽  
Vol 5 (3) ◽  
pp. 1079-1081
Author(s):  
Shigeru Kimura ◽  
Tatsuya Matsumura ◽  
Katsuyuki Kinoshita ◽  
Keiichi Hirano ◽  
Hiroshi Kihara
Keyword(s):  
High Resolution ◽  
Digital Imaging ◽  
Imaging System ◽  
Silicon Crystal ◽  
Stage Structure ◽  
Magnification Factor ◽  
Double Crystal ◽  
X Ray ◽  
Imaging Detector ◽  
High Resolution Images

A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 µm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 µm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure.

scholarly journals Structural and elemental changes in glioblastoma cells in situ: complementary imaging with high resolution visible light- and X-ray microscopy

The Analyst ◽  
2017 ◽  
Vol 142 (2) ◽  
pp. 356-365 ◽  
Author(s):  
Tanja Dučić ◽  
Tatjana Paunesku ◽  
Si Chen ◽  
Milena Ninković ◽  
Swetlana Speling ◽  
...  
Keyword(s):  
High Resolution ◽  
Light Microscopy ◽  
Visible Light ◽  
Structural Changes ◽  
Glioblastoma Cells ◽  
X Ray ◽  
In Cells

The study explores application of X-ray and high resolution visible light microscopy to investigate the elemental and structural changes in cells from 3 patient derived glioblastoma samples.

Nanosecond Exposure Time Soft X-Ray Contact Imaging

1985 ◽  
Vol 43 ◽  
pp. 600-601
Author(s):  
R. J. Rosser
Keyword(s):  
High Resolution ◽  
Light Microscopy ◽  
Visible Light ◽  
Biological Material ◽  
Electronics Industry ◽  
Recording Medium ◽  
Contact Printing ◽  
X Ray ◽  
Original Specimen ◽  
Recording Material

Soft x-ray contact microscopy has been pursued for many years because of the potential advantages of 1 to 10 nm electro-magetic radiation for imaging biological materials. These are the lower damage and greater penetration than electrons and considerably higher resolution than visible light microscopy, both possible without exotic optics.The technique is similar to contact printing. The object to be viewed is placed as close as possible to the recording medium which is then exposed to a suitable x-ray source.. The sample is removed from the recording medium which is then chemically developed. The result is map of the x-ray opacity of the original specimen.The high resolution has only become reality in recent years with the use of x-ray photo-resists as the recording material. These were origionally developed for use in the electronics industry but have been used for contact images of biological material.

Eu3+-Doped Y2O3-SiO2 Nanocomposite Obtained by a Sol-Gel Method

2001 ◽  
Vol 676 ◽  
Author(s):  
Carla Cannas ◽  
Mariano Casu ◽  
Roberta Licheri ◽  
Anna Musinu ◽  
Giorgio Piccaluga ◽  
...  
Keyword(s):  
Amorphous Silica ◽  
Sol Gel ◽  
Silica Matrix ◽  
Luminescence Spectroscopy ◽  
X Ray Diffraction ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Excited Luminescence ◽  
The Eu

ABSTRACTA Y2O3-SiO2 nanocomposite doped with Eu3+ was obtained by a sol-gel method and characterized by X-ray diffraction, IR, 29Si NMR and laser-excited luminescence spectroscopy. It was found that small (2-3 nm) yttria nanoparticles are homogeneously dispersed in, and interacting with, the amorphous silica matrix. Luminescence spectroscopy indicates that the Eu3+ ion is preferentially located inside or at the surface of highly disordered Y2O3 nanoparticles. These luminescent nanocomposites form a class of materials which could find applications in the field of phosphors.

Sign in / Sign up

Export Citation Format

Share Document