Reductive Silylation of Polyoxovanadate Surfaces using Mashima’s Reagent

Author(s):  
Sourav Chakraborty ◽  
Ellen Matson

Here, we present the first example of reductive silylation for oxygen defect formation at the surface of a polyoxometalate. Upon addition of 1,4,-bis(trimthylsilyl)dihydropyrazine (Pyz(SiMe3)2) to [V6O7(OMe)12]-1, quantitative formation of the...

2009 ◽  
Vol 40 (2) ◽  
pp. 296-298 ◽  
Author(s):  
C. Chandrinou ◽  
N. Boukos ◽  
C. Stogios ◽  
A. Travlos

2016 ◽  
Vol 92 ◽  
pp. 791-800 ◽  
Author(s):  
Phillip Hamer ◽  
Nitin Nampalli ◽  
Ziv Hameiri ◽  
Moonyong Kim ◽  
Daniel Chen ◽  
...  

2019 ◽  
Vol 116 (35) ◽  
pp. 17181-17186 ◽  
Author(s):  
Steven R. Spurgeon ◽  
Michel Sassi ◽  
Colin Ophus ◽  
Joanne E. Stubbs ◽  
Eugene S. Ilton ◽  
...  

Oxygen defects govern the behavior of a range of materials spanning catalysis, quantum computing, and nuclear energy. Understanding and controlling these defects is particularly important for the safe use, storage, and disposal of actinide oxides in the nuclear fuel cycle, since their oxidation state influences fuel lifetimes, stability, and the contamination of groundwater. However, poorly understood nanoscale fluctuations in these systems can lead to significant deviations from bulk oxidation behavior. Here we describe the use of aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy to resolve changes in the local oxygen defect environment in UO2+x surfaces. We observe large image contrast and spectral changes that reflect the presence of sizable gradients in interstitial oxygen content at the nanoscale, which we quantify through first-principles calculations and image simulations. These findings reveal an unprecedented level of excess oxygen incorporated in a complex near-surface spatial distribution, offering additional insight into defect formation pathways and kinetics during UO2 surface oxidation.


2019 ◽  
Vol 58 (9) ◽  
pp. 6143-6154 ◽  
Author(s):  
Gabriel L. Murphy ◽  
Chun-Hai Wang ◽  
Zhaoming Zhang ◽  
Piotr M. Kowalski ◽  
George Beridze ◽  
...  

2021 ◽  
Vol MA2021-01 (45) ◽  
pp. 1795-1795
Author(s):  
Nicholas Szaro ◽  
Salai Cheettu Ammal ◽  
Andreas Heyden

2021 ◽  
Vol 515 ◽  
pp. 230602
Author(s):  
Nicholas A. Szaro ◽  
Salai Cheettu Ammal ◽  
Fanglin Chen ◽  
Andreas Heyden

2015 ◽  
Vol 118 (1) ◽  
pp. 015704 ◽  
Author(s):  
T. Angeletos ◽  
E. N. Sgourou ◽  
A. Andrianakis ◽  
A. Diamantopoulou ◽  
A. Chroneos ◽  
...  

Author(s):  
H. Watanabe ◽  
B. Kabius ◽  
B. Roas ◽  
K. Urban

Recently it was reported that the critical current density(Jc) of YBa2Cu2O7, in the presence of magnetic field, is enhanced by ion irradiation. The enhancement is thought to be due to the pinning of the magnetic flux lines by radiation-induced defects or by structural disorder. The aim of the present study was to understand the fundamental mechanisms of the defect formation in association with the pinning effect in YBa2Cu3O7 by means of high-resolution electron microscopy(HRTEM).The YBa2Cu3O7 specimens were prepared by laser ablation in an insitu process. During deposition, a substrate temperature and oxygen atmosphere were kept at about 1073 K and 0.4 mbar, respectively. In this way high quality epitaxially films can be obtained with the caxis parallel to the <100 > SrTiO3 substrate normal. The specimens were irradiated at a temperature of 77 K with 173 MeV Xe ions up to a dose of 3.0 × 1016 m−2.


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