Point defect detection and strain mapping in Si single crystal by two-dimensional multiplication moiré method
Keyword(s):
A two-dimensional multiplication moiré method was developed to detect point and line defects of crystals in a wide field of view.
Keyword(s):
1991 ◽
Vol 49
◽
pp. 374-375
Keyword(s):
Keyword(s):
2012 ◽
Vol 5
(2)
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pp. 2169-2220
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