Fabrication of strontium included hafnium oxide thin film based Al/Sr:HfO2/n-Si MIS-Schottky barrier diodes for tuned electrical behavior

2021 ◽  
Author(s):  
Harishsenthil Perumal ◽  
J. Chandrasekaran ◽  
Dheivasigamani Thangaraju ◽  
Balasubramani Vellingri

Growth behavior of pure and Sr included HfO2 composite thin film for the different concentrations of Sr (5, 10, and 15 Wt.%) through the Jet Nebulizer Spray Pyrolysis technique were...

2018 ◽  
Vol 1 (2) ◽  
pp. 9-12
Author(s):  
S.P. Soundararajan ◽  
M Murugan ◽  
K Mohanraj ◽  
Babu Balraj ◽  
Tamiloli Devendhiran

In this work the copper oxide thin films have been coated using Jet nebulizer spray pyrolysis technique. The prepared CuO thin films were characterized by various techniques such as X-ray diffraction (XRD), Scanning Electron Microscope (SEM) and Energy dispersive X-ray spectroscopy (EDX) techniques, in order to study its crystalline nature, particle size and the band gap respectively.


CrystEngComm ◽  
2015 ◽  
Vol 17 (13) ◽  
pp. 2624-2628 ◽  
Author(s):  
Sanjay S. Latthe ◽  
P. Sudhagar ◽  
C. Ravidhas ◽  
A. Jennifer Christy ◽  
D. David Kirubakaran ◽  
...  

The pocket-sized nebulizer equipped jet-spray coating of a monoclinic CuO crystallite surface showed excellent superhydrophobic self-cleaning properties owing to its compact crystallite texture and high surface roughness.


2021 ◽  
Vol 33 (12) ◽  
pp. 2999-3005
Author(s):  
G. Lavanya ◽  
N. Sivanandan

In this study, molybdenum trioxide (MoO3) thin films were coated with various Mo concentrations 1, 2, 3 and 4 wt.% referred as L1, L2, L3 and L4 respectively on to the silica substrate calcined at 450 ºC by a facile, rapid cost-effective and a custom-made jet nebulizer spray pyrolysis (JNSP) technique. The concentration impact on the structural, morphological and compositional parameters were examined by XRD, FESEM, EDX, FTIR and Raman studies. The XRD peaks confirmed the presence of the orthorhombic phase of MoO3 (α-MoO3) in the prepared films. FESEM images depicted their nanorod structured morphology. EDX spectra confirm the presence of elements such as oxygen (O) and molybdenum (Mo). Molecular fingerprint of the samples were diagnosed by probing their molecular vibrations through the Raman Spectroscopy. Vibrational frequencies of the bonds in the samples was investigated by FTIR. The I-V measurements were analyzed in light and dark conditions for the n-MoO3/p-Si junction diode.


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