Residual resistivity as an independent indicator of resonant levels in semiconductors
A novel method which allows to distinguish between resonant and non-resonant impurities in thermoelectric semiconductors is presented.
1995 ◽
Vol 53
◽
pp. 1020-1021
1997 ◽
Vol 71-72
(1-3)
◽
pp. 403-425
◽
2020 ◽
Keyword(s):
1878 ◽
Vol 5
(109supp)
◽
pp. 1725-1726
1962 ◽
Vol 23
(10)
◽
pp. 654-658
◽
Keyword(s):