Direct analysis of tellurium solid samples with a two-jet arc plasma using electrothermal vaporization
Keyword(s):
The combination of two-jet arc plasma optical emission spectrometry (TJP-OES) and electrothermal vaporization (ETV) for sample introduction is proposed for the first time.
2000 ◽
Vol 55
(1)
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pp. 37-47
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2007 ◽
Vol 86
(1)
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pp. 102-111
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2002 ◽
Vol 57
(3)
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pp. 485-494
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