SIMS simultaneous measurement of oxygen-hydrogen isotopes and water content for hydrous geological samples

2021 ◽  
Author(s):  
Qing Yang ◽  
Xiaoping Xia ◽  
Zexian Cui ◽  
Wanfeng Zhang ◽  
Yanqiang Zhang ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Water Content ◽  
Simultaneous Measurement ◽  
Secondary Ion Mass Spectrometry ◽  
Hydrogen Isotopes ◽  
Geological Samples ◽  
Isotopic Compositions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Analytical Protocols

In this study, we developed two new SIMS (secondary ion mass spectrometry) analytical protocols to simultaneously measure oxygen-hydrogen (O-H) isotopic compositions and water content for hydrous geological samples. These two...

Zircon water content: reference material development and simultaneous measurement of oxygen isotopes by SIMS

2019 ◽  
Vol 34 (6) ◽  
pp. 1088-1097 ◽  
Author(s):  
Xiao-Ping Xia ◽  
Ze-Xian Cui ◽  
Wancai Li ◽  
Wan-Feng Zhang ◽  
Qing Yang ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Reference Material ◽  
Water Content ◽  
Simultaneous Measurement ◽  
Secondary Ion Mass Spectrometry ◽  
High Water ◽  
Material Development ◽  
Geological Processes ◽  
Suitable Reference ◽  
Secondary Ion

Zircon water content is an important physicochemical parameter for many geological processes, yet its measurement by the secondary ion mass spectrometry (SIMS) technique is hampered by the lack of suitable reference materials and high water background, especially if large-geometry (LG)-SIMS is used.

A secondary ion mass spectrometry (SIMS) re-evaluation of B and Li isotopic compositions of Cu-bearing elbaite from three global localities

2011 ◽  
Vol 75 (4) ◽  
pp. 2485-2494 ◽  
Author(s):  
T. Ludwig ◽  
H. R. Marschall ◽  
P. A. E. Pogge von Strandmann ◽  
B. M. Shabaga ◽  
M. Fayek ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Secondary Ion Mass Spectrometry ◽  
Isotopic Compositions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Isotope Analyses

AbstractCu-bearing elbaite from Paraíba (Brazil) is a highly-prized gem tourmaline. Specimens of similar quality from localities in Mozambique and Nigeria are being sold, and reliable provenance tools are required to distinguish specimens from the original locality from ‘Paraíba-type’ tourmaline from Africa. Here we present Li and B isotope analyses of Cu-bearing elbaite from all three localities and demonstrate the suitability of these isotope systems as a provenance tool. Isotopic profiles across chemically zoned grains revealed homogenous B and Li isotopic compositions, demonstrating a strong advantage of their application as a provenance tool as opposed to major, minor or trace element signatures.Li and B isotopes of all investigated samples of Cu-bearing elbaites from the three localities are within the range of previously published granitic and pegmatitic tourmaline. Anomalous isotope compositions published previously for these samples are corrected by our results.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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