scholarly journals Helium structures around SF5+ and SF6+: A new intermolecular potential and mass sepctrometry experiments

2021 ◽  
Author(s):  
Eva Zunzunegui-Bru ◽  
Elisabeth Gruber ◽  
Stefan Bergmeister ◽  
Miriam Meyer ◽  
Fabio Zappa ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Intermolecular Potential ◽  
Sulphur Hexafluoride ◽  
Helium Clusters ◽  
Ion Yields

Helium clusters attaching the recently experimentally observed sulphur hexafluoride SF6+ and sulphur pentafluoride SF5+ ions are investigated in a combined experimental and theoretical effort. Mass spectrometry ion yields are obtained...

Ion Yields and Fragmentation Processes in the Radiolysis of HCl and DCl

1974 ◽  
Vol 52 (3) ◽  
pp. 359-364 ◽  
Author(s):  
Peter F. Carr ◽  
Patricia Christensen ◽  
Derek E. Wilson ◽  
David A. Armstrong
Keyword(s):  
Mass Spectrometry ◽  
Electron Impact ◽  
Isotope Effect ◽  
Relative Abundance ◽  
Fast Electron ◽  
Ionization Yield ◽  
Ionization Processes ◽  
Ion Yields ◽  
Fragmentation Processes ◽  
Primary Ionization

The ionization yield from fast electron impact on DCl under radiolysis conditions at 200 to 650 Torr was found to be 1.006 ± 0.023 times that from HCl. Also primary ionization processes were investigated by mass spectrometry. The relative abundance of Cl+ from HCl near threshold at 17.4 eV was about twice that from DCl, but processes with onset at and above 21.0 eV did not exhibit an isotope effect. The interpretation of the results and their implications concerning the mechanism of radiolysis of HCl were discussed.

scholarly journals Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams

2013 ◽  
Vol 85 (12) ◽  
pp. 5654-5658 ◽  
Author(s):  
Sadia Sheraz née Rabbani ◽  
Andrew Barber ◽  
John S. Fletcher ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Mass Spectrometry ◽  
Water Cluster ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Mass Spectrometry ◽  
Ion Yields ◽  
Secondary Ion

scholarly journals Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams

2015 ◽  
Vol 87 (4) ◽  
pp. 2367-2374 ◽  
Author(s):  
Sadia Sheraz née Rabbani ◽  
Irma Berrueta Razo ◽  
Taylor Kohn ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Mass Spectrometry ◽  
Comparative Study ◽  
Water Cluster ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Mass Spectrometry ◽  
Ion Yields ◽  
Secondary Ion

Study of decomposition of sulphur hexafluoride by gas chromatography/mass spectrometry

1997 ◽  
Vol 11 (15) ◽  
pp. 1643-1648 ◽  
Author(s):  
Orsolya Kóréh ◽  
Tamás Rikker ◽  
Gábor Molnár ◽  
Bashir Mohamed Mahara ◽  
Kornél Torkos ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Gas Chromatography ◽  
Gas Chromatography Mass Spectrometry ◽  
Sulphur Hexafluoride ◽  
Chromatography Mass Spectrometry

High-Precision Characterization of III-Nitride Semiconductor Alloys with Secondary Ion Mass Spectrometry (SIMS)

1995 ◽  
Vol 395 ◽  
Author(s):  
J W. Erickson ◽  
Y. Gao ◽  
R. G. Wilson
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Great Sensitivity ◽  
Common Interest ◽  
Matrix Composition ◽  
Calibration Curves ◽  
Ion Mass Spectrometry ◽  
Ion Yields ◽  
Secondary Ion ◽  
Better Than

ABSTRACTSamples of representative AlxGayIn1−x-yN compositions have been studied with secondary ion mass spectrometry (SIMS). First, ionized species of common interest (H, B, C, O, Mg, Si, and Cd) were implanted into the Ill-nitride samples to provide calibrated standards. Depth profiles and conversion factors for quantification of dopants were then obtained using O2+ or Cs+bombardment and positive or negative SIMS to measure B+ and Mg+; H−, B−, C−, O−, and Si−; and CdCs+. In addition calibration curves for quantification of stoichiometry were prepared using MCs+ ions (NCs+, AlCs−, GaCs+, InCs+) for which the ion yields are relatively independent of the matrix composition; and using atomic, dimer, and trimer ions (Al, Ga, In, Al2, Ga2, In2, Al3, Ga3) which are very sensitive to matrix composition. The empirical calibration curves show small non-linearities. Dopant concentrations can be quantified with great sensitivity (detection limits usually below 1 ppm), accuracy (usually better than 10%), and precision (better than 25%). Matrix stoichiometry can be quantified with an accuracy of about 1–3%.

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