Multi-resolution simulation of DNA transport through large synthetic nanostructures

2022 ◽  
Author(s):  
Adnana Choudhary ◽  
Christopher Maffeo ◽  
Aleksei Aksimentiev
Keyword(s):  
Modeling And Simulation ◽  
Dna Transport ◽  
Sensing Systems ◽  
Resolution Simulation

Modeling and simulation has become an invaluable partner in development of nanopore sensing systems. The key advantage of the nanopore sensing method --- the ability to rapidly detect individual biomolecules...

A Framework of Digital Factory System Using Multi-Resolution Simulation

2012 ◽  
Vol 159 ◽  
pp. 12-17 ◽  
Author(s):  
Zai Lin Guan ◽  
Chuang Jian Wang ◽  
Yun Feng Wu ◽  
Xin Yu Shao
Keyword(s):  
Modeling And Simulation ◽  
Simulation Method ◽  
Simulation Technology ◽  
Enterprise Information ◽  
Enterprise Information Systems ◽  
Digital Factory ◽  
Core Technology ◽  
Multi Level ◽  
Resolution Simulation ◽  
New Framework

Digital Factory (DF) technology is one of the most important part of manufacturer enterprise information systems, its core technology is modeling & simulation. This paper introduced the digital factory concept and its functions with multi-level multi-resolution modeling and simulation method; we established a new framework of the digital factory technology. It combines with the features of DF and simulation technology which expands the development of DF and application of simulation technology. A case was taken to show the feasibility of multi-level modeling & multi-resolution simulation technology attaching to the DF technology.

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

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