Graphene-Mo2C heterostructure for highly responsive broadband photodetector

2021 ◽  
Author(s):  
Xiaozhi Bao ◽  
Tian Sun ◽  
Yan Liu ◽  
Chuan Xu ◽  
Weiliang Ma ◽  
...  
Keyword(s):  
Wavelength Range ◽  
Silicon Photodiode

Photodetector based on intrinsic graphene can operate over a broad wavelength range with ultrafast response, but its responsivity is much lower than commercial silicon photodiode. The combination of graphene with...

Analysis of electron-diffraction intensity profiles using a photodiode-array detection system

1983 ◽  
Vol 41 ◽  
pp. 322-323
Author(s):  
J. B. Warren
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Detection System ◽  
High Energy ◽  
Photographic Emulsion ◽  
Diffraction Intensity ◽  
Silicon Photodiode ◽  
Photodiode Array Detection ◽  
Analog To Digital ◽  
Photodiode Array

Electron diffraction intensity profiles have been used extensively in studies of polycrystalline and amorphous thin films. In previous work, diffraction intensity profiles were quantitized either by mechanically scanning the photographic emulsion with a densitometer or by using deflection coils to scan the diffraction pattern over a stationary detector. Such methods tend to be slow, and the intensities must still be converted from analog to digital form for quantitative analysis. The Instrumentation Division at Brookhaven has designed and constructed a electron diffractometer, based on a silicon photodiode array, that overcomes these disadvantages. The instrument is compact (Fig. 1), can be used with any unmodified electron microscope, and acquires the data in a form immediately accessible by microcomputer.Major components include a RETICON 1024 element photodiode array for the de tector, an Analog Devices MAS-1202 analog digital converter and a Digital Equipment LSI 11/2 microcomputer. The photodiode array cannot detect high energy electrons without damage so an f/1.4 lens is used to focus the phosphor screen image of the diffraction pattern on to the photodiode array.

Application of pyrometer and standard sample to determine surface temperature of studied materials

2019 ◽  
pp. 9-13
Author(s):  
V.Ya. Mendeleyev ◽  
V.A. Petrov ◽  
A.V. Yashin ◽  
A.I. Vangonen ◽  
O.K. Taganov
Keyword(s):  
Composite Material ◽  
Surface Temperature ◽  
Relative Error ◽  
Wavelength Range ◽  
Standard Sample ◽  
A Priori ◽  
Temperature Changes ◽  
Surface Temperatures ◽  
Relative Errors ◽  
Normal Emissivity

Determining the surface temperature of materials with unknown emissivity is studied. A method for determining the surface temperature using a standard sample of average spectral normal emissivity in the wavelength range of 1,65–1,80 μm and an industrially produced Metis M322 pyrometer operating in the same wavelength range. The surface temperature of studied samples of the composite material and platinum was determined experimentally from the temperature of a standard sample located on the studied surfaces. The relative error in determining the surface temperature of the studied materials, introduced by the proposed method, was calculated taking into account the temperatures of the platinum and the composite material, determined from the temperature of the standard sample located on the studied surfaces, and from the temperature of the studied surfaces in the absence of the standard sample. The relative errors thus obtained did not exceed 1,7 % for the composite material and 0,5% for the platinum at surface temperatures of about 973 K. It was also found that: the inaccuracy of a priori data on the emissivity of the standard sample in the range (–0,01; 0,01) relative to the average emissivity increases the relative error in determining the temperature of the composite material by 0,68 %, and the installation of a standard sample on the studied materials leads to temperature changes on the periphery of the surface not exceeding 0,47 % for composite material and 0,05 % for platinum.

Double Beam Spectrophotometer for Simultaneous Measurements of the Upwelling Sea Radiance and the Incident See Irradiance

2019 ◽  
pp. 105-110
Author(s):  
Mikhail Yongon Lee ◽  
Sergei V. Fedorov
Keyword(s):  
Spectral Characteristics ◽  
Sea Surface ◽  
Input Port ◽  
Silicon Photodiode ◽  
New Approach ◽  
Surface Irradiance ◽  
Simultaneous Measurements ◽  
Double Beam

The article describes the structure and the operation principle of the spectrophotometer developed on the basis of a compact rapid monochromator with one input port and two output ports and a radiometric unit where upwelling radiation radiance and sea surface irradiance channels are located. A new approach to measurements of spectral characteristics of upwelling radiation of sea based on combination of advantages of a double beam photometer with a photomultiplier and a directreading photometer with a highstability silicon photodiode for its absolute adjustment in energy units is implemented.

Results of Spatial Structure of Atmosphere Radiation in a Spectral Range (1.5–2) µm Research

2018 ◽  
pp. 7-13
Author(s):  
Anton M. Mishchenko ◽  
Sergei S. Rachkovsky ◽  
Vladimir A. Smolin ◽  
Igor V . Yakimenko
Keyword(s):  
Spatial Structure ◽  
Unmanned Aerial Vehicle ◽  
Wavelength Range ◽  
Spectral Range ◽  
Near Ir ◽  
Optoelectronic Systems ◽  
Aerial Vehicle

Results of experimental studying radiation spatial structure of atmosphere background nonuniformities and of an unmanned aerial vehicle being the detection object are presented. The question on a possibility of its detection using optoelectronic systems against the background of a cloudy field in the near IR wavelength range is also considered.

Wideband Visible Wavelength Range MEMS Fabry-Perot Tunable Filter with Ag Alloy Mirror

2012 ◽  
Vol 132 (2) ◽  
pp. 25-30 ◽  
Author(s):  
Nozomu Hirokubo ◽  
Hiroshi Komatsu ◽  
Nobuaki Hashimoto ◽  
Makoto Sonehara ◽  
Toshiro Sato
Keyword(s):  
Wavelength Range ◽  
Tunable Filter ◽  
Visible Wavelength ◽  
Visible Wavelength Range ◽  
Fabry Perot

Wide-Tuning-Wavelength-Range LGLC Laser with Low-Loss Dual-Core Spot Size Converter

2012 ◽  
Vol E95.C (7) ◽  
pp. 1272-1275
Author(s):  
Takanori SUZUKI ◽  
Hideo ARIMOTO ◽  
Takeshi KITATANI ◽  
Aki TAKEI ◽  
Takafumi TANIGUCHI ◽  
...  
Keyword(s):  
Wavelength Range ◽  
Spot Size ◽  
Low Loss ◽  
Dual Core
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