An improved PD-AsLS method of baseline estimated in EDXRF analysis

2021 ◽  
Author(s):  
Qingxian Zhang ◽  
Hui Li ◽  
Hongfei Xiao ◽  
Jian Zhang ◽  
Xiaozhe Li ◽  
...  
Keyword(s):  
Least Squares ◽  
Least Squares Method ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
Baseline Correction ◽  
Penalized Least Squares ◽  
X Ray ◽  
Edxrf Analysis ◽  
Asymmetric Least Squares

Baseline correction is an important step in energy-dispersive X-ray fluorescence analysis. The asymmetric least squares method (AsLS), adaptive iteratively reweighted penalized least squares method (airPLS), and asymmetrically reweighted penalized least...

Multiple Constrained Reweighted Penalized Least Squares for Spectral Baseline Correction

2020 ◽  
Vol 74 (12) ◽  
pp. 1443-1451
Author(s):  
Guofeng Yang ◽  
Jiacai Dai ◽  
Xiangjun Liu ◽  
Meng Chen ◽  
Xiaolong Wu
Keyword(s):  
Least Squares ◽  
Least Squares Method ◽  
Baseline Correction ◽  
Penalized Least Squares ◽  
Baseline Drift ◽  
Background Elimination ◽  
Asymmetric Least Squares ◽  
Quantitative Analyses ◽  
Left And Right ◽  
Additional Constraints

Baseline drift occurs in various measured spectra, and the existence of a baseline signal will influence qualitative and quantitative analyses. Therefore, it is necessary to perform baseline correction or background elimination before spectral analysis. In this paper, a multiple constrained asymmetric least squares method based on the penalized least squares principle is proposed for baseline correction. The method takes both baseline and peak characteristics into account. Based on the prior knowledge that the left and right boundaries of characteristic peaks should be symmetrical, additional constraints of penalized least squares are added, which ensure the symmetry of spectra. The experimental results of the proposed method on simulated spectra are compared with existing baseline correction methods to verify the accuracy and adaptability of the proposed method. The method is also successfully applied to the baseline correction of real spectra. The results show that it can be effective for estimating the baseline. In addition, this method can also be applied to the baseline correction of other similar spectral signals.

scholarly journals An Automatic Baseline Correction Method Based on the Penalized Least Squares Method

Sensors ◽  
2020 ◽  
Vol 20 (7) ◽  
pp. 2015
Author(s):  
Feng Zhang ◽  
Xiaojun Tang ◽  
Angxin Tong ◽  
Bin Wang ◽  
Jingwei Wang
Keyword(s):  
Least Squares ◽  
Least Squares Method ◽  
Correction Method ◽  
Baseline Correction ◽  
Penalized Least Squares ◽  
Gaussian Peak ◽  
Baseline Drift ◽  
Extended Range ◽  
Different Types ◽  
Smoothness Parameter

Baseline drift spectra are used for quantitative and qualitative analysis, which can easily lead to inaccurate or even wrong results. Although there are several baseline correction methods based on penalized least squares, they all have one or more parameters that must be optimized by users. For this purpose, an automatic baseline correction method based on penalized least squares is proposed in this paper. The algorithm first linearly expands the ends of the spectrum signal, and a Gaussian peak is added to the expanded range. Then, the whole spectrum is corrected by the adaptive smoothness parameter penalized least squares (asPLS) method, that is, by turning the smoothing parameter λ of asPLS to obtain a different root-mean-square error (RMSE) in the extended range, the optimal λ is selected with minimal RMSE. Finally, the baseline of the original signal is well estimated by asPLS with the optimal λ. The paper concludes with the experimental results on the simulated spectra and measured infrared spectra, demonstrating that the proposed method can automatically deal with different types of baseline drift.

Baseline correction for infrared spectra using adaptive smoothness parameter penalized least squares method

2020 ◽  
Vol 53 (3) ◽  
pp. 222-233 ◽  
Author(s):  
Feng Zhang ◽  
Xiaojun Tang ◽  
Angxin Tong ◽  
Bin Wang ◽  
Jingwei Wang ◽  
...  
Keyword(s):  
Least Squares ◽  
Infrared Spectra ◽  
Least Squares Method ◽  
Baseline Correction ◽  
Penalized Least Squares ◽  
Smoothness Parameter

The Resolution of X-Ray Fluorescence Spectra by the Least Squares Method

1978 ◽  
Vol 22 ◽  
pp. 337-342
Author(s):  
Colin G. Sanderson
Keyword(s):  
Least Squares ◽  
Fluorescence Spectra ◽  
Gamma Ray ◽  
Least Squares Method ◽  
Computer Programs ◽  
Energy Dispersive ◽  
X Ray ◽  
Computer Codes

Least squares computer programs have been used for the resolution of complex gamma-ray spectra obtained from NaI(Tl) detectors for many years. With the addition of computer codes, which account for the differences “between gamma-ray and x-ray fluorescence spectra, these same programs can be used to quantify energy dispersive x-ray fluorescence data.

scholarly journals Applying Energy-Dispersive X-Ray Fluorescence Analysis to Detect Tungsten Inclusions in Nuclear Fuel Rod End Plug TIG Welds

2021 ◽  
Vol 2021 ◽  
pp. 1-10
Author(s):  
Runqiu Gu ◽  
Jianfeng Cheng ◽  
Wanchang Lai ◽  
Guangxi Wang
Keyword(s):  
Nuclear Fuel ◽  
Fluorescence Analysis ◽  
Simulation Method ◽  
Energy Dispersive ◽  
Tungsten Particle ◽  
X Rays ◽  
X Ray ◽  
Fuel Rod ◽  
Edxrf Analysis ◽  
Relative Standard

This study proposes a new method of detecting tungsten inclusions in nuclear fuel rod upper-end plug welds using energy-dispersive X-ray fluorescence (EDXRF) analysis. The Monte Carlo simulation method was used to simulate the process of detecting tungsten inclusions in nuclear fuel rod upper-end plug welds by the EDXRF. The detectable tungsten particle diameters in the zirconium alloy at different depths in welds and the detection limits of the trace tungsten dispersed in welds were obtained. Then, we constructed an experimental device that uses a CdTe detector with an X-ray tube. The results showed that the relative standard deviation of the net count rate of tungsten K-series characteristic X-rays [W (Kα)] was 1.46%, and the optimum parameters are a tube voltage of 150 kV and current of 0.5 mA. These values were used to perform energy-dispersive X-ray fluorescence analysis. These results were compared to the X-ray radiographic results, which were broadly similar. Furthermore, the results of EDXRF analysis were more legible and reliable than those from X-ray radiographic inspections. This study demonstrates the feasibility of applying EDXRF analysis to detect tungsten inclusions.

The Recessed Source Geometry for Source Excited X-Ray Fluorescence Analysis

1985 ◽  
Vol 29 ◽  
pp. 545-550 ◽  
Author(s):  
C. A. N. Conde ◽  
J. M. F. dos Santos
Keyword(s):  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
X Ray ◽  
Edxrf Analysis ◽  
Source Distance ◽  
Source Geometry ◽  
Annular Source ◽  
Better Than

AbstractDifferent geometries are considered for source excited energy-dispersive X-ray fluorescence (EDXRF) analysis Systems, including the recessed source geometry introduced in the present work. The calculated physical excitation-detection efficiencies, for the side (or annular), central, receded and recessed source geometries are presented as a function of the target to source distance, for Ca, K, S and Si targets excited with a Fe-55 XBF-3 X-ray source and xenon filled gas proportional scintillation counters. The last two geometries present in gênerai the highest efficiencies. The recessed source geometry présent the best performance with peak efficiencies a factor of 3.3 better than those for the standard side or annular source geometries.

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