Spectral characterisation of a traditional Mesoamerican dye: relationship between in situ identification on the 16th century Codex Borbonicus manuscript and composition of Justicia spicigera plant extract

The Analyst ◽  
2021 ◽  
Vol 146 (8) ◽  
pp. 2520-2530
Author(s):  
Lucie Arberet ◽  
Fabien Pottier ◽  
Anne Michelin ◽  
Witold Nowik ◽  
Ludovic Bellot-Gurlet ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Plant Extract ◽  
Analytical Techniques ◽  
16Th Century ◽  
Physico Chemical ◽  
Spectral Characterisation ◽  
Chemical Knowledge

The identification of Justicia spicigera in the Codex Borbonicus by Raman spectroscopy motivated the development of a multi-analytical techniques approach to broaden the physico-chemical knowledge regarding this traditional dye source.

In situ Raman spectroscopy at the Voroneţ Monastery (16th century, Romania): New results for green and blue pigments

2014 ◽  
Vol 72 ◽  
pp. 142-148 ◽  
Author(s):  
Nicolae Buzgar ◽  
Andrei Buzatu ◽  
Andrei-Ionuţ Apopei ◽  
Vasile Cotiugă
Keyword(s):  
Raman Spectroscopy ◽  
16Th Century ◽  
In Situ Raman Spectroscopy ◽  
In Situ Raman

Phase Transformation Related Conductivity Degradation of NiO Doped YSZ: An In-situ Micro-Raman Analysis

2012 ◽  
Vol 1385 ◽  
Author(s):  
Haruo Kishimoto ◽  
Keiji Yashiro ◽  
Taro Shimonosono ◽  
Manuel E. Brito ◽  
Katsuhiko Yamaji ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Phase Transformation ◽  
Analytical Techniques ◽  
Cubic Phase ◽  
Study Phase ◽  
Raman Analysis ◽  
Controlled Atmospheres ◽  
Micro Raman Spectroscopy ◽  
Reducing Atmosphere

ABSTRACTIn-situ micro Raman spectroscopy has been adopted as one of the most powerful analytical techniques with high spacial resolution under controlled atmospheres. In the present study, phase transformation of NiO doped yttria stabilized zirconia (YSZ) was monitored by in-situ micro-Raman spectroscopy. Raman spectra change caused by the phase transformation from the cubic phase to the tetragonal phase was observed for the NiO doped YSZ during annealing at a high temperature of 1173 K under reducing atmosphere.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

In Situ Raman Spectroscopy Studies on La2CaB10O19 Crystal Growth

2020 ◽  
Vol 20 (10) ◽  
pp. 6604-6609
Author(s):  
Shanshan Liu ◽  
Guochun Zhang ◽  
Kai Feng ◽  
Yanyang Han ◽  
Tao He ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Crystal Growth ◽  
In Situ Raman Spectroscopy ◽  
In Situ Raman ◽  
Spectroscopy Studies

scholarly journals Retraction of “High-Capacitance Mechanism for Ti3C2Tx MXene by in Situ Electrochemical Raman Spectroscopy Investigation″

ACS Nano ◽  
2021 ◽  
Author(s):  
Minmin Hu ◽  
Zhaojin Li ◽  
Tao Hu ◽  
Shihao Zhu ◽  
Chao Zhang ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
High Capacitance
Sign in / Sign up

Export Citation Format

Share Document