Quantitative characterization of interface stress using a nanoindentation technique for high performance flexible electronics
Keyword(s):
A simple method was introduced to precisely characterize the interface stress of flexible OFETs using nanoindentation. The interface stress could be tuned by controlling the interface adhesion energy between layers, via controlling the film formation process.
2014 ◽
Vol 37
(12)
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pp. 1438-1447
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2017 ◽
Vol 139
(2)
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Keyword(s):
2010 ◽
Vol 346
(2)
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pp. 296-301
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Keyword(s):
2002 ◽
Vol 52
(2)
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pp. 49-56
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1984 ◽
Vol 51
(01)
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pp. 016-021
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