In situ surface-enhanced electronic and vibrational Raman scattering spectroscopy at metal/molecule interfaces

Nanoscale ◽  
2020 ◽  
Vol 12 (45) ◽  
pp. 22988-22994
Author(s):  
Motoharu Inagaki ◽  
Kenta Motobayashi ◽  
Katsuyoshi Ikeda
Keyword(s):  
Raman Scattering ◽  
Surface Charges ◽  
Raman Scattering Spectroscopy ◽  
Dielectric Interface ◽  
Surface Enhanced

Both information about adsorbates and surface charges at the metal/dielectric interface were simultaneously obtained using in situ SERS.

Bifunctional Au@Pt core–shell nanostructures for in situ monitoring of catalytic reactions by surface-enhanced Raman scattering spectroscopy

Nanoscale ◽  
2014 ◽  
Vol 6 (15) ◽  
pp. 9063-9070 ◽  
Author(s):  
Zhi Yong Bao ◽  
Dang Yuan Lei ◽  
Ruibin Jiang ◽  
Xin Liu ◽  
Jiyan Dai ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Surface Enhanced Raman Scattering ◽  
In Situ Monitoring ◽  
Core Shell ◽  
Raman Scattering Spectroscopy ◽  
Shell Nanostructures ◽  
Surface Enhanced ◽  
Surface Enhanced Raman ◽  
Enhanced Raman Scattering

Surface-enhanced Raman scattering spectroscopy using bifunctional Au@Pt core–shell nanostructures can monitor the catalytic reaction dynamics in real time.

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

Sign in / Sign up

Export Citation Format

Share Document