Experimental evidence for onset of L1–L3M5 transition at Z = 75 through measurements of fluorescence and Coster–Kronig yields for W and Re

2021 ◽  
Author(s):  
Vibha Ayri ◽  
Sandeep Kaur ◽  
Anil Kumar ◽  
M. Czyzycki ◽  
A. G. Karydas ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Experimental Evidence ◽  
Absorption Edge ◽  
X Ray ◽  
Line Intensities ◽  
Radiation Induced

L shell fluorescence and Coster–Kronig yields for W and Re were deduced from synchrotron radiation induced X-ray line intensities measured at different incident energies across the Li absorption edge energies of both elements based on HFS and DHF models.

The spatial distribution of calcium in alginate gel beads analysed by synchrotron-radiation induced X-ray emission (SRIXE)

1997 ◽  
Vol 297 (2) ◽  
pp. 101-105 ◽  
Author(s):  
Beathe Thu ◽  
Gudmund Skjåk-Bræk ◽  
Fulvio Micali ◽  
Franco Vittur ◽  
Roberto Rizzo
Keyword(s):  
Spatial Distribution ◽  
Synchrotron Radiation ◽  
X Ray ◽  
Alginate Gel ◽  
Gel Beads ◽  
Radiation Induced

scholarly journals Analysis of individual microscopic particles by means of synchrotron radiation induced x-ray micro fluorescence

1992 ◽  
Vol 50 (2) ◽  
pp. 1766-1767
Author(s):  
K. Janssens ◽  
F. Adams ◽  
M.L. Rivers ◽  
K.W. Jones
Keyword(s):  
Synchrotron Radiation ◽  
Detection Limits ◽  
Fluorescence Analysis ◽  
Individual Particle ◽  
Quantitative Character ◽  
Particle Analysis ◽  
X Ray ◽  
Interesting Approach ◽  
Radiation Induced ◽  
Backscattered Electron

Micro-SXRF (Synchrotron X-ray Fluorescence) or micro-SRIXE (Synchrotron Radiation Induced X-ray Emission) is a microanalytical technique which combines the sensitivity of more conventional microchemical methods such as Secondary Ion Microscopy (SIMS) and μ-PIXE (Proton Induced X-ray Emission) with the non-destructive and quantitative character of X-ray fluorescence analysis. The detection limits attainable at current SXRF-facilities are situated in the ppm (and in favourable cases the sub-ppm) range. The sensitivity of SRIXE can be used advantageously in individual particle analysis. This type of analysis is used, e.g., for studying sources of athmospheric pollution. Analysis of standard NIST micro-spheres at the NSLS-SRIXE facility yielded minimum detection limits in the 1 to 100 ppm range for particle sizes of around 10 to 30 μm.An interesting approach to individual particle characterisation is by means of electron microprobe analysis (EPMA). By using the backscattered electron signals, in an automated fashion, particles can be easily located on a filter substrate and their size and shape determined.

scholarly journals Synchrotron Radiation-Induced X-Ray Emission to Identify Metal Ions in Preparations of Purified Protein

BioTechniques ◽  
2002 ◽  
Vol 32 (1) ◽  
pp. 134-141
Author(s):  
Thomas Pfister ◽  
Huan Feng ◽  
Eckard Wimmer ◽  
Keith W. Jones
Keyword(s):  
Synchrotron Radiation ◽  
Metal Ions ◽  
X Ray ◽  
Radiation Induced

Analysis of synchrotron radiation induced X-ray emission spectra with R environment

2013 ◽  
Vol 93 ◽  
pp. 82-86 ◽  
Author(s):  
Krzysztof Banas ◽  
Agnieszka M. Banas ◽  
Mariusz Gajda ◽  
Wojciech M. Kwiatek ◽  
Bohdan Pawlicki ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Emission Spectra ◽  
X Ray ◽  
Radiation Induced

A method to stabilize the incident X-ray energy for anomalous diffraction measurements

2017 ◽  
Vol 24 (4) ◽  
pp. 781-786
Author(s):  
Wenjia Wang ◽  
Xiaoyun Yang ◽  
Guangcai Chang ◽  
Pengfei An ◽  
Kewen Cha ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Data Collection ◽  
Absorption Edge ◽  
Feedback Loop ◽  
Inflection Point ◽  
Single Crystal Diffraction ◽  
Double Crystal ◽  
Anomalous Diffraction ◽  
X Ray ◽  
Double Crystal Monochromator

A method to calibrate and stabilize the incident X-ray energy for anomalous diffraction data collection is provided and has been successfully used at the single-crystal diffraction beamline 1W2B at the Beijing Synchrotron Radiation Facilities. Employing a feedback loop to control the movement of the double-crystal monochromator, this new method enables the incident X-ray energy to be kept within a 0.2 eV range at the inflection point of the absorption edge.

Synchrotron radiation induced X-ray fluorescence at LURE

1989 ◽  
Vol 131 (2) ◽  
pp. 399-413 ◽  
Author(s):  
I. Brissaud ◽  
J. X. Wang ◽  
P. Chevallier
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
Radiation Induced
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