scholarly journals Resolving Multiphoton Processes with High-Order Anisotropy Ultrafast X-ray Scattering

2020 ◽  
Author(s):  
Adi Natan ◽  
Aviad Schori ◽  
Grace Owolabi ◽  
James Patrick Cryan ◽  
James M Glownia ◽  
...  

We present first results on ultrafast X-ray scattering of strongly driven molecular Iodine and analysis of high-order anisotropic components of the scattering signal, up to four-photon absorption. We discuss the...

2020 ◽  
Vol 91 (12) ◽  
pp. 123501
Author(s):  
M. Šmíd ◽  
C. Baehtz ◽  
A. Pelka ◽  
A. Laso García ◽  
S. Göde ◽  
...  

2020 ◽  
Vol 321 ◽  
pp. 12039
Author(s):  
Jana Šmilauerová ◽  
Petr Harcuba ◽  
Josef Stráský ◽  
Jitka Stráská ◽  
Miloš Janeček ◽  
...  

Small-angle X-ray scattering (SAXS) is a technique which makes use of elastic scattering of X-ray radiation on inhomogeneities in electron density in the studied material In particular, a difference in chemical compositions between individual phases can be detected. In this research, SAXS was used to study the evolution of α particles in aged samples of a metastable β titanium alloy, Ti-6.8Mo-4.5Fe-1.5Al (LCB). In order to obtain scattering patterns for a known crystallographic orientation, the experiments were carried out on single crystals grown by a floating zone technique. Aged single-crystalline samples were measured in three different orientations, namely (001), (110) and (111) planes of the bcc β matrix oriented perpendicularly to the primary beam. Resulting scattering patterns exhibited symmetries which correlated with the orientation of the studied sample. A simple theoretical model was developed to interpret the shape and orientation of the observed scattering streaks. Good qualitative agreement between experimental data and simulation was found and the first results of the model are presented in this paper.


Author(s):  
Hoyoung Jang ◽  
Hyeong-Do Kim ◽  
Minseok Kim ◽  
Sang Han Park ◽  
Soonnam Kwon ◽  
...  

1996 ◽  
Vol 11 (2) ◽  
pp. 273-276
Author(s):  
D. W. Hua ◽  
G. Beaucage ◽  
M. S. Kent

In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 Å−1 in q. This allows the resolution of surface features of 10 to 1000 Å. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera.


IUCrJ ◽  
2017 ◽  
Vol 4 (5) ◽  
pp. 604-613 ◽  
Author(s):  
Julien R. Lhermitte ◽  
Aaron Stein ◽  
Cheng Tian ◽  
Yugang Zhang ◽  
Lutz Wiegart ◽  
...  

Small-angle X-ray scattering (SAXS) often includes an unwanted background, which increases the required measurement time to resolve the sample structure. This is undesirable in all experiments, and may make measurement of dynamic or radiation-sensitive samples impossible. Here, we demonstrate a new technique, applicable when the scattering signal is background-dominated, which reduces the requisite exposure time. Our method consists of exploiting coherent interference between a sample with a designed strongly scattering `amplifier'. A modified angular correlation function is used to extract the symmetry of the interference term; that is, the scattering arising from the interference between the amplifier and the sample. This enables reconstruction of the sample's symmetry, despite the sample scattering itself being well below the intensity of background scattering. Thus, coherent amplification is used to generate a strong scattering term (well above background), from which sample scattering is inferred. We validate this method using lithographically defined test samples.


2017 ◽  
Vol 19 (30) ◽  
pp. 19740-19749 ◽  
Author(s):  
Mats Simmermacher ◽  
Niels E. Henriksen ◽  
Klaus B. Møller

This paper demonstrates how the time-dependent scattering signal of electronic wave packets in the hydrogen atom can be expressed analytically.


IUCrJ ◽  
2017 ◽  
Vol 4 (4) ◽  
pp. 431-438 ◽  
Author(s):  
Mika Pflüger ◽  
Victor Soltwisch ◽  
Jürgen Probst ◽  
Frank Scholze ◽  
Michael Krumrey

Grazing-incidence small-angle X-ray scattering (GISAXS) is often used as a versatile tool for the contactless and destruction-free investigation of nanostructured surfaces. However, due to the shallow incidence angles, the footprint of the X-ray beam is significantly elongated, limiting GISAXS to samples with typical target lengths of several millimetres. For many potential applications, the production of large target areas is impractical, and the targets are surrounded by structured areas. Because the beam footprint is larger than the targets, the surrounding structures contribute parasitic scattering, burying the target signal. In this paper, GISAXS measurements of isolated as well as surrounded grating targets in Si substrates with line lengths from 50 µm down to 4 µm are presented. For the isolated grating targets, the changes in the scattering patterns due to the reduced target length are explained. For the surrounded grating targets, the scattering signal of a 15 µm × 15 µm target grating structure is separated from the scattering signal of 100 µm × 100 µm nanostructured surroundings by producing the target with a different orientation with respect to the predominant direction of the surrounding structures. As virtually all lithographically produced nanostructures have a predominant direction, the described technique allows GISAXS to be applied in a range of applications,e.g. for characterization of metrology fields in the semiconductor industry, where up to now it has been considered impossible to use this method due to the large beam footprint.


Author(s):  
F. Mirloup ◽  
R. Vulleumier ◽  
S. Bratos ◽  
M. Wulff ◽  
A. Plech

Author(s):  
Eva-Maria Mandelkow ◽  
Eckhard Mandelkow ◽  
Joan Bordas

When a solution of microtubule protein is changed from non-polymerising to polymerising conditions (e.g. by temperature jump or mixing with GTP) there is a series of structural transitions preceding microtubule growth. These have been detected by time-resolved X-ray scattering using synchrotron radiation, and they may be classified into pre-nucleation and nucleation events. X-ray patterns are good indicators for the average behavior of the particles in solution, but they are difficult to interpret unless additional information on their structure is available. We therefore studied the assembly process by electron microscopy under conditions approaching those of the X-ray experiment. There are two difficulties in the EM approach: One is that the particles important for assembly are usually small and not very regular and therefore tend to be overlooked. Secondly EM specimens require low concentrations which favor disassembly of the particles one wants to observe since there is a dynamic equilibrium between polymers and subunits.


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