scholarly journals In situ anion-doped epitaxial strontium titanate films

2020 ◽  
Vol 22 (42) ◽  
pp. 24796-24800
Author(s):  
M. Tyunina ◽  
O. Pacherova ◽  
N. Nepomniashchaia ◽  
V. Vetokhina ◽  
S. Cichon ◽  
...  

Oxygen vacancies, hydrogen, or nitrogen are introduced in strontium titanate during the epitaxial growth of compressively strained films.

Author(s):  
J. S. Maa ◽  
Thos. E. Hutchinson

The growth of Ag films deposited on various substrate materials such as MoS2, mica, graphite, and MgO has been investigated extensively using the in situ electron microscopy technique. The three stages of film growth, namely, the nucleation, growth of islands followed by liquid-like coalescence have been observed in both the vacuum vapor deposited and ion beam sputtered thin films. The mechanisms of nucleation and growth of silver films formed by ion beam sputtering on the (111) plane of silicon comprise the subject of this paper. A novel mode of epitaxial growth is observed to that seen previously.The experimental arrangement for the present study is the same as previous experiments, and the preparation procedure for obtaining thin silicon substrate is presented in a separate paper.


Coatings ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 584
Author(s):  
Rui Dang ◽  
Liqiu Ma ◽  
Shengguo Zhou ◽  
Deng Pan ◽  
Bin Xia

Ultra-high molecular weight polythene (UHMWPE), with outstanding characteristics, is widely applied in modern industry, while it is also severely limited by its inherent shortcomings, which include low hardness, poor wear resistance, and easy wear. Implementation of feasible protection on ultra-high molecular weight polythene to overcome its shortcomings would be of significance. In the present study, amorphous carbon (a-C) film was fabricated on ultra-high molecular weight polythene (UHMWPE) to provide good protection, and the relevant growth mechanism of a-C film was revealed by controlling carbon plasma currents. The results showed the in situ transition layer, in the form of chemical bonds, was formed between the UHMWPE substrate and the a-C film with the introduction of carbon plasma, which provided strong adhesion, and then the a-C film continued epitaxial growth on the in situ transition layer with the treatment of carbon plasma. This in situ growth of a-C film, including the in situ transition layer and the epitaxial growth layer, significantly improved the wetting properties, mechanical properties, and tribological properties of UHMWPE. In particular, good protection by in situ growth a-C film on UHMWPE was achieved during sliding wear.


2021 ◽  
Vol 3 (2) ◽  
Author(s):  
Jaime Souto-Casares ◽  
Nicola A. Spaldin ◽  
Claude Ederer

2020 ◽  
Vol 7 (16) ◽  
pp. 2969-2978
Author(s):  
Jie-hao Li ◽  
Jie Ren ◽  
Ying Liu ◽  
Hui-ying Mu ◽  
Rui-hong Liu ◽  
...  

Cl-Doped Bi2O2CO3 is prepared using ionic liquids as dopants and the oxygen-vacancy-induced photocatalytic mechanism is revealed.


2010 ◽  
Vol 445 ◽  
pp. 175-178 ◽  
Author(s):  
Takayuki Goto ◽  
Petr Pulpan ◽  
Takahiro Takei ◽  
Yoshihiro Kuroiwa ◽  
Satoshi Wada

The conditions for strontium titanate (SrTiO3, ST) nucleation and particle growth were investigated for preparation of ST/ barium titanate (BaTiO3, BT) complex nanoparticles. The conditions with and without ST nucleation were clarified. Epitaxial growth of ST layer on the BT substrate particles was studied using both conditions. Unfortunately, the ST/BT complex nanoparticles with heteroepitaxial interface were not prepared, but a new two-step solvothermal reaction method was developed. Finally, the ST/BT complex nanoparticles without heteroepitaxial interface were successfully prepared.


2010 ◽  
Vol 645-648 ◽  
pp. 271-276 ◽  
Author(s):  
Robert E. Stahlbush ◽  
Rachael L. Myers-Ward ◽  
Brenda L. VanMil ◽  
D. Kurt Gaskill ◽  
Charles R. Eddy

The recently developed technique of UVPL imaging has been used to track the path of basal plane dislocations (BPDs) in SiC epitaxial layers. The glide of BPDs during epitaxial growth has been observed and the role of this glide in forming half-loop arrays has been examined. The ability to track the path of BPDs through the epitaxy has made it possible to develop a BPD reduction process for epitaxy grown on 8° offcut wafers, which uses an in situ growth interrupt and has achieved a BPD reduction of > 98%. The images also provide insight into the strong BPD reduction that typically occurs in epitaxy grown on 4° offcut wafers.


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