High-quality-factor anodic alumina optical microcavities prepared by cyclic anodizing with voltage versus optical path length modulation

2020 ◽  
Vol 8 (12) ◽  
pp. 3991-3995 ◽  
Author(s):  
Sergey E. Kushnir ◽  
Tatiana Yu. Komarova ◽  
Kirill S. Napolskii
Keyword(s):  
Quality Factor ◽  
Path Length ◽  
Optical Path Length ◽  
Optical Path ◽  
Anodic Alumina ◽  
High Quality Factor ◽  
High Quality ◽  
Voltage Versus ◽  
Precise Control ◽  
Optical Microcavities

Precise control over the porous structure of anodic alumina allows one to produce high-quality-factor optical microcavities.

Anodizing with voltage versus optical path length modulation: a new tool for the preparation of photonic structures

2018 ◽  
Vol 6 (45) ◽  
pp. 12192-12199 ◽  
Author(s):  
Sergey E. Kushnir ◽  
Tatyana Yu. Pchelyakova ◽  
Kirill S. Napolskii
Keyword(s):  
Photonic Crystal ◽  
Path Length ◽  
Optical Path Length ◽  
Optical Path ◽  
Anodic Alumina ◽  
Direct Control ◽  
High Quality ◽  
Voltage Versus ◽  
Photonic Structures

Direct control of the optical path length of each layer inside anodic alumina produces a high quality photonic crystal.

High-quality factor optical microcavities using oxide apertured micropillars

2005 ◽  
Vol 87 (3) ◽  
pp. 031105 ◽  
Author(s):  
N. G. Stoltz ◽  
M. Rakher ◽  
S. Strauf ◽  
A. Badolato ◽  
D. D. Lofgreen ◽  
...  
Keyword(s):  
Quality Factor ◽  
High Quality Factor ◽  
High Quality ◽  
Optical Microcavities

A Long Bar Type Silicon Resonator with a High Quality Factor

2014 ◽  
Vol 134 (2) ◽  
pp. 26-31 ◽  
Author(s):  
Nguyen Van Toan ◽  
Masaya Toda ◽  
Yusuke Kawai ◽  
Takahito Ono
Keyword(s):  
Quality Factor ◽  
High Quality Factor ◽  
High Quality ◽  
Type Silicon ◽  
Silicon Resonator

Investigation of particulate systems using optical pathlength spectroscopy

2000 ◽  
Vol 627 ◽  
Author(s):  
Gabriel Popescu ◽  
Aristide Dogariu
Keyword(s):  
Path Length ◽  
Random Media ◽  
Michelson Interferometer ◽  
Industrial Process ◽  
Optical Path Length ◽  
Industrial Applications ◽  
Optical Path ◽  
Interference Signal ◽  
Optical Length ◽  
Reference Mirror

ABSTRACTIn many industrial applications involving granular media, knowledge about the structural transformations suffered during the industrial process is desirable. Optical techniques are noninvasive, fast, and versatile tools for monitoring such transformations. We have recently introduced optical path-length spectroscopy as a new technique for random media investigation. The principle of the method is to use a partially coherent source in a Michelson interferometer, where the fields from a reference mirror and the sample are combined to obtain an interference signal. When the system under investigation is a multiple-scattering medium, by tuning the optical length of the reference arm, the optical path-length probability density of light backscattered from the sample is obtained. This distribution carries information about the structural details of the medium. In the present paper, we apply the technique of optical path-length spectroscopy to investigate inhomogeneous distributions of particulate dielectrics such as ceramics and powders. The experiments are performed on suspensions of systems with different solid loads, as well as on powders and suspensions of particles with different sizes. We show that the methodology is highly sensitive to changes in volume concentration and particle size and, therefore, it can be successfully used for real-time monitoring. In addition, the technique is fiber optic-based and has all the advantages associated with the inherent versatility.

scholarly journals Coherent suppression of backscattering in optical microresonators

2020 ◽  
Vol 9 (1) ◽  
Author(s):  
Andreas Ø. Svela ◽  
Jonathan M. Silver ◽  
Leonardo Del Bino ◽  
Shuangyou Zhang ◽  
Michael T. M. Woodley ◽  
...  
Keyword(s):  
Quality Factor ◽  
Bulk Material ◽  
Near Field ◽  
High Quality Factor ◽  
Dual Frequency ◽  
High Quality ◽  
Frequency Combs ◽  
Optical Microresonators ◽  
Whispering Gallery ◽  
The Stability

AbstractAs light propagates along a waveguide, a fraction of the field can be reflected by Rayleigh scatterers. In high-quality-factor whispering-gallery-mode microresonators, this intrinsic backscattering is primarily caused by either surface or bulk material imperfections. For several types of microresonator-based experiments and applications, minimal backscattering in the cavity is of critical importance, and thus, the ability to suppress backscattering is essential. We demonstrate that the introduction of an additional scatterer into the near field of a high-quality-factor microresonator can coherently suppress the amount of backscattering in the microresonator by more than 30 dB. The method relies on controlling the scatterer position such that the intrinsic and scatterer-induced backpropagating fields destructively interfere. This technique is useful in microresonator applications where backscattering is currently limiting the performance of devices, such as ring-laser gyroscopes and dual frequency combs, which both suffer from injection locking. Moreover, these findings are of interest for integrated photonic circuits in which back reflections could negatively impact the stability of laser sources or other components.

scholarly journals Stray light characterization with ultrafast time-of-flight imaging

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
L. Clermont ◽  
W. Uhring ◽  
M. Georges
Keyword(s):  
Path Length ◽  
Imaging System ◽  
Time Of Flight ◽  
Optical Path Length ◽  
Optical Path ◽  
Stray Light ◽  
Laser Source ◽  
Space Telescopes ◽  
Characterization Methods ◽  
Instance Space

AbstractUnderstanding stray light (SL) is a crucial aspect in the development of high-end optical instruments, for instance space telescopes. As it drives image quality, SL must be controlled by design and characterized experimentally. However, conventional SL characterization methods are limited as they do not provide information on its origins. The problem is complex due to the diversity of light interaction processes with surfaces, creating various SL contributors. Therefore, when SL level is higher than expected, it can be difficult to determine how to improve the system. We demonstrate a new approach, ultrafast time-of-flight SL characterization, where a pulsed laser source and a streak camera are used to record individually SL contributors which travel with a specific optical path length. Furthermore, the optical path length offers a means of identification to determine its origin. We demonstrate this method in an imaging system, measuring and identifying individual ghosts and scattering components. We then show how it can be used to reverse-engineer the instrument SL origins.

Multifold coupling enabled high quality factor toroidal resonances in metasurfaces

2020 ◽  
Vol 127 (19) ◽  
pp. 193103
Author(s):  
Deepak Kumar ◽  
Surya Pranav Ambatipudi ◽  
Sabyasachi Banerjee ◽  
Ranjan Kumar ◽  
Dibakar Roy Chowdhury
Keyword(s):  
Quality Factor ◽  
High Quality Factor ◽  
High Quality
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