High-sensitivity X-ray detectors based on solution-grown caesium lead bromide single crystals

2020 ◽  
Vol 8 (4) ◽  
pp. 1248-1256 ◽  
Author(s):  
Hongjian Zhang ◽  
Fangbao Wang ◽  
Yufei Lu ◽  
Qihao Sun ◽  
Yadong Xu ◽  
...  
Keyword(s):  
Single Crystals ◽  
High Sensitivity ◽  
Crystalline Quality ◽  
High Crystalline Quality ◽  
X Ray ◽  
Lead Bromide ◽  
Asymmetric Electrodes

High-sensitivity X-ray detectors made of solution grown CsPbBr3 single crystals with high crystalline quality was reported in this work. The device with asymmetric electrodes configuration shows high sensitivity of 1256 μC Gy−1 cm−2.

Mixed‐Cation MA x Cs 1− x PbBr 3 Perovskite Single Crystals with Composition Management for High‐Sensitivity X‐Ray Detection

2020 ◽  
Vol 14 (10) ◽  
pp. 2000226 ◽  
Author(s):  
Zhengfang Fan ◽  
Jiang Liu ◽  
Wentao Zuo ◽  
Guoqiang Liu ◽  
Xulin He ◽  
...  
Keyword(s):  
Single Crystals ◽  
High Sensitivity ◽  
X Ray ◽  
Mixed Cation

scholarly journals Strain relaxation in GaN layers grown on porous GaN sublayers

1999 ◽  
Vol 4 (1) ◽  
Author(s):  
M. Mynbaeva ◽  
A. Titkov ◽  
A. Kryzhanovski ◽  
I. Kotousova ◽  
A.S. Zubrilov ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Strain Relaxation ◽  
Vapour Phase ◽  
Crystalline Quality ◽  
Epitaxial Layers ◽  
High Quality ◽  
High Crystalline Quality ◽  
Vapour Phase Epitaxy ◽  
X Ray ◽  
Good Surface

We have studied epitaxial GaN layers grown by hydride vapour phase epitaxy (HVPE) on porous GaN sublayers formed on SiC substrates. It was shown that these layers can be grown with good surface morphology and high crystalline quality. X-ray, Raman and photoluminescent (PL) measurements showed that the stress in the layers grown on porous GaN was reduced to 0.1-0.2 GPa, while the stress in the layers grown directly on 6H-SiC substrates remains at its usual level of about 1 GPa. Thus, we have shown that growth on porous GaN sublayer is a promising method for fabrication of high quality epitaxial layers of GaN with low strain values.

Room temperature growth of CH3NH3PbCl3 single crystals by solvent evaporation method

CrystEngComm ◽  
2019 ◽  
Vol 21 (4) ◽  
pp. 656-661 ◽  
Author(s):  
Pronoy Nandi ◽  
Chandan Giri ◽  
Diptikanta Swain ◽  
U. Manju ◽  
Dinesh Topwal
Keyword(s):  
Single Crystals ◽  
Room Temperature ◽  
Solvent Evaporation ◽  
Crystalline Quality ◽  
Solvent Evaporation Method ◽  
High Crystalline Quality ◽  
Temperature Growth ◽  
Evaporation Method ◽  
First Time

Rectangular shaped, high crystalline quality, defect free and colorless 3D perovskite single crystals of CH3NH3PbCl3 were grown using the solvent evaporation method at room temperature for the first time.

scholarly journals Atomistic Surface Passivation of CH3NH3PbI3 Perovskite Single Crystals for Highly Sensitive Coplanar-Structure X-Ray Detectors

Research ◽  
2020 ◽  
Vol 2020 ◽  
pp. 1-10
Author(s):  
Yilong Song ◽  
Liqi Li ◽  
Weihui Bi ◽  
Mingwei Hao ◽  
Yifei Kang ◽  
...  
Keyword(s):  
Single Crystals ◽  
Generation X ◽  
Surface Passivation ◽  
Crystal Surface ◽  
High Sensitivity ◽  
Ion Migration ◽  
Metallic Lead ◽  
X Ray ◽  
Highly Sensitive ◽  
Mobile Ions

Organic-inorganic halide perovskites (OIHPs) are recognized as the promising next-generation X-ray detection materials. However, the device performance is largely limited by the ion migration issue of OIHPs. Here, we reported a simple atomistic surface passivation strategy with methylammonium iodide (MAI) to remarkably increase the ion migration activation energy of CH3NH3PbI3 single crystals. The amount of MAI deposited on the crystal surface is finely regulated by a self-assemble process to effectively suppress the metallic lead defects, while not introducing extra mobile ions, which results in significantly improved dark current stability of the coplanar-structure devices under a large electric field of 100 V mm-1. The X-ray detectors hence exhibit a record-high sensitivity above 700,000 μC Gyair‐1 cm‐2 under continuum X-ray irradiation with energy up to 50 keV, which enables an ultralow X-ray detection limit down to 1.5 nGyair s-1. Our findings will allow for the dramatically reduced X-ray exposure of human bodies in medical imaging applications.

Synthesis of PbI2 nanowires for high sensitivity photodetectors

RSC Advances ◽  
2016 ◽  
Vol 6 (64) ◽  
pp. 59445-59449 ◽  
Author(s):  
Jinqiu Liu ◽  
Zhaohuan Liang ◽  
Bo Xu ◽  
Hui Xiang ◽  
Yidong Xia ◽  
...  
Keyword(s):  
High Sensitivity ◽  
Vapor Transport ◽  
Crystalline Quality ◽  
Physical Vapor Transport ◽  
Lead Iodide ◽  
High Crystalline Quality ◽  
Catalyst Free ◽  
Transport Method ◽  
Vapor Transport Method

A simple catalyst-free physical vapor transport method was used to synthesize lead iodide (PbI2) nanowires of high crystalline quality.

scholarly journals Lead-halide Cs4PbBr6 single crystals for high-sensitivity radiation detection

2021 ◽  
Vol 13 (1) ◽  
Author(s):  
Yang Li ◽  
Wenyi Shao ◽  
Liang Chen ◽  
Juan Wang ◽  
Jing Nie ◽  
...  
Keyword(s):  
Single Crystals ◽  
Alpha Particle ◽  
Radiation Detection ◽  
High Sensitivity ◽  
Time Response ◽  
Fast Time ◽  
X Rays ◽  
X Ray ◽  
X Ray Imaging ◽  
Lead Halide

AbstractLow-dimensional perovskite materials and their derivatives with excellent optical performance are promising candidates for light-emission applications. Herein, centimeter lead-halide Cs4PbBr6 single crystals (SCs), which have been used for radiation detection with the indirect conversion method, were synthesized by a facile solution process. The Cs4PbBr6 scintillator exhibits bright green emission peaking at 525 nm and a high photoluminescence quantum yield (up to 86.7%) under 375 nm laser excitation. The Cs4PbBr6 SCs exhibit high sensitivity to 40 keV X-rays, with a favorable linearity with the X-ray exposure dose rate, and the detection limit is as low as 64.4 nGyair/s. The scintillation time-response performance of the Cs4PbBr6 SCs was acquired by a time-correlated single-photon counting system under alpha-particle excitation. The Cs4PbBr6 SCs exhibit a very fast time response (τav = 1.46 ns) to alpha particles from a 241Am radiation source. This value is comparable to that of the commercial plastic scintillator EJ-228 (τav = 1.31 ns) and much faster than that of the LYSO(Ce) scintillator (τav = 36.17 ns). Conceptual X-ray imaging and alpha-particle pulse height spectroscopy experiments were also performed. These results demonstrated the potential of Cs4PbBr6 SCs for radiation detection applications, including X-ray imaging and charged particle detection with fast scintillation decay time and high sensitivity.

scholarly journals Inch-Sized Thin Metal Halide Perovskite Single-Crystal Wafers for Sensitive X-Ray Detection

2022 ◽  
Vol 9 ◽  
Author(s):  
Anbo Feng ◽  
Shengdan Xie ◽  
Xiuwei Fu ◽  
Zhaolai Chen ◽  
Wei Zhu
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Indium Tin Oxide ◽  
High Sensitivity ◽  
Metal Halide ◽  
Large Area ◽  
X Ray ◽  
Metal Halide Perovskite ◽  
Imaging Application ◽  
Halide Perovskite

Metal halide perovskite single crystals are a promising candidate for X-ray detection due to their large atomic number and high carrier mobility and lifetime. However, it is still challenging to grow large-area and thin single crystals directly onto substrates to meet real-world applications. In this work, millimeter-thick and inch-sized methylammonium lead tribromide (MAPbBr3) single-crystal wafers are grown directly on indium tin oxide (ITO) substrates through controlling the distance between solution surface and substrates. The single-crystal wafers are polished and treated with O3 to achieve smooth surface, lower trap density, and better electrical properties. X-ray detectors with a high sensitivity of 632 µC Gyair−1 cm−2 under –5 V and 525 µC Gyair−1 cm−2 under –1 V bias can be achieved. This work provides an effective way to fabricate substrate-integrated, large-area, and thickness-controlled perovskite single-crystal X-ray detectors, which is instructive for developing imaging application based on perovskite single crystals.

Zone-axis ALCHEMI for the rapid assessment of site occupancies in garnets

1986 ◽  
Vol 44 ◽  
pp. 706-707
Author(s):  
M.T. Otten ◽  
P.R. Buseck
Keyword(s):  
Single Crystals ◽  
Rapid Assessment ◽  
Site Occupancy ◽  
Zone Axis ◽  
Synthetic Compounds ◽  
X Ray ◽  
Large Group ◽  
Crystallographic Planes

ALCHEMI (Atom Location by CHannelling-Enhanced Microanalysis) is a TEM technique for determining site occupancies in single crystals. The method uses the channelling of incident electrons along specific crystallographic planes. This channelling results in enhanced x-ray emission from the atoms on those planes, thereby providing the required site-occupancy information. ALCHEMI has been applied with success to spinel, olivine and feldspar. For the garnets, which form a large group of important minerals and synthetic compounds, the channelling effect is weaker, and significant results are more difficult to obtain. It was found, however, that the channelling effect is pronounced for low-index zone-axis orientations, yielding a method for assessing site occupancies that is rapid and easy to perform.

An x-ray microprobe based upon a close-coupled focal-spot / glass capillary arrangement

1992 ◽  
Vol 50 (2) ◽  
pp. 1758-1759
Author(s):  
D. A. Carpenter ◽  
M. A. Taylor
Keyword(s):  
Imaging Techniques ◽  
Fluorescence Analysis ◽  
High Sensitivity ◽  
Specimen Preparation ◽  
X Rays ◽  
Glass Capillary ◽  
Close Coupling ◽  
X Ray ◽  
Point To Point ◽  
Beam Damage

The development of intense sources of x rays has led to renewed interest in the use of microbeams of x rays in x-ray fluorescence analysis. Sparks pointed out that the use of x rays as a probe offered the advantages of high sensitivity, low detection limits, low beam damage, and large penetration depths with minimal specimen preparation or perturbation. In addition, the option of air operation provided special advantages for examination of hydrated systems or for nondestructive microanalysis of large specimens.The disadvantages of synchrotron sources prompted the development of laboratory-based instrumentation with various schemes to maximize the beam flux while maintaining small point-to-point resolution. Nichols and Ryon developed a microprobe using a rotating anode source and a modified microdiffractometer. Cross and Wherry showed that by close-coupling the x-ray source, specimen, and detector, good intensities could be obtained for beam sizes between 30 and 100μm. More importantly, both groups combined specimen scanning with modern imaging techniques for rapid element mapping.

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