scholarly journals Flexible transparent film heaters using a ternary composite of silver nanowire, conducting polymer, and conductive oxide

RSC Advances ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 5731-5737 ◽  
Author(s):  
Juhyung Park ◽  
Dongjun Han ◽  
Seunghwan Choi ◽  
Yunkyung Kim ◽  
Jeonghun Kwak
Keyword(s):  
Thin Film ◽  
Conducting Polymer ◽  
High Performance ◽  
Silver Nanowire ◽  
Stable Operation ◽  
Transparent Film ◽  
Ternary Composite ◽  
Conductive Oxide

A high-performance flexible thin film heater using AgNW–PEDOT:PSS/ITO, exhibiting stable operation in water.

Robust nanoscale contact of silver nanowire electrodes to semiconductors to achieve high performance chalcogenide thin film solar cells

Nano Energy ◽  
2018 ◽  
Vol 53 ◽  
pp. 675-682 ◽  
Author(s):  
Sangyeob Lee ◽  
Jun Su Lee ◽  
Jiseong Jang ◽  
Ki-Ha Hong ◽  
Doh-Kwon Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
High Performance ◽  
Silver Nanowire ◽  
Thin Film Solar Cells ◽  
Chalcogenide Thin Film

High-performance C60 and picene thin film field-effect transistors with conducting polymer electrodes in bottom contact structure

2009 ◽  
Vol 10 (3) ◽  
pp. 432-436 ◽  
Author(s):  
Yumiko Kaji ◽  
Ryoji Mitsuhashi ◽  
Xuesong Lee ◽  
Hideki Okamoto ◽  
Takashi Kambe ◽  
...  
Keyword(s):  
Thin Film ◽  
Conducting Polymer ◽  
Field Effect ◽  
High Performance ◽  
Contact Structure ◽  
Field Effect Transistors ◽  
Bottom Contact ◽  
Polymer Electrodes

Silver nanowire-polymer composite electrode for high performance solution-processed thin-film transistors

2012 ◽  
Vol 13 (10) ◽  
pp. 1881-1886 ◽  
Author(s):  
Liang-Hsiang Chen ◽  
Pang Lin ◽  
Ming-Chou Chen ◽  
Peng-Yi Huang ◽  
Choongik Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Polymer Composite ◽  
Thin Film Transistors ◽  
High Performance ◽  
Composite Electrode ◽  
Silver Nanowire ◽  
Solution Processed

High-resolution scanning electron microscopy of thin-film magnetic media of magnetic recording disk

1992 ◽  
Vol 50 (2) ◽  
pp. 1334-1335
Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
High Resolution ◽  
Magnetic Recording ◽  
High Performance ◽  
Magnetic Hysteresis ◽  
Grain Structure ◽  
Magnetic Media ◽  
Cross Sectional ◽  
Resolution Observation

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.

The Structure and Properties of MoSi2 Thin Film in Mos Process

1980 ◽  
Vol 38 ◽  
pp. 326-327
Author(s):  
C.K. Wu ◽  
P. Chang ◽  
N. Godinho
Keyword(s):  
Thin Film ◽  
Integrated Circuits ◽  
High Performance ◽  
Large Scale ◽  
Process Development ◽  
Structure And Properties ◽  
Metal Silicides ◽  
High Oxidation ◽  
Important Approach ◽  
High Oxidation Resistance

Recently, the use of refractory metal silicides as low resistivity, high temperature and high oxidation resistance gate materials in large scale integrated circuits (LSI) has become an important approach in advanced MOS process development (1). This research is a systematic study on the structure and properties of molybdenum silicide thin film and its applicability to high performance LSI fabrication.

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