The local strain distribution in bilayer materials: a multiscale study

Nanoscale ◽  
2020 ◽  
Vol 12 (11) ◽  
pp. 6456-6461
Author(s):  
Zongrui Pei ◽  
Sai Mu ◽  
Wenmei Ming

Recent studies show that small geometric changes can result in dramatic changes in physical properties and need to be carefully evaluated.

2021 ◽  
pp. 2100201
Author(s):  
Philipp Jordt ◽  
Stjepan B. Hrkac ◽  
Jorit Gröttrup ◽  
Anton Davydok ◽  
Christina Krywka ◽  
...  

Author(s):  
Kamal Elbachiri ◽  
Pascal Doumalin ◽  
Jéro^me Crépin ◽  
Michel Bornert ◽  
Pierre Barberis ◽  
...  

2007 ◽  
Vol 558-559 ◽  
pp. 1139-1144 ◽  
Author(s):  
Hai Wen Luo ◽  
Lian Zi An ◽  
Hong Wei Ni

The classical JMAK equation was modified by combination with distribution density of the rate parameter k, which was deduced from a normal distribution of local strain. The modified equation is able to calculate the JMAK plots and the average Avrami exponent to characterize the entire heterogeneous recrystallization process. This new extension can successfully describe the relevant experimental observations, such as a smaller exponent than the basic JMAK theory predicts, and a decreasing slope of JMAK plots with the proceeding recrystallization. Moreover, it reveals that the Avrami exponent observed experimentally should significantly decrease with the increasing standard deviation of local strain distribution. In addition, it has a great potential to explain why most of experimentally observed values of Avrami exponents are less than 2 and why the Avrami exponent is insensitive to temperature and deformation conditions when the real standard deviation of local strain distribution in deformed metals is known.


2014 ◽  
Vol 783-786 ◽  
pp. 2016-2021
Author(s):  
Dinh Thanh Khan ◽  
Shotaro Takeuchi ◽  
Yoshiaki Nakamura ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  

We investigated local strain distribution in a cross-sectional area throughout the thickness of a thick aluminum nitride (AlN) film epitaxially grown on a trench-patterned AlN/α-Al2O3 template using X-ray microdiffraction measurements for AlN and Bragg reflections. The results show that the presence of voids caused by the trench pattern strongly influences on the distribution of the strain components in the and directions, which are perpendicular to the trench lines. Discrepancy between strain values obtained from the two Bragg reflections was shown to be the result of twisting of the crystal domains about the axis in the thick AlN film.


Sign in / Sign up

Export Citation Format

Share Document