Revealing inconsistencies in X-ray width methods for nanomaterials
Since the landmark development of the Scherrer Method a century ago, multiple generations of width methods for X-ray diffraction originated to non-invasively and rapidly characterize the property-controlling sizes of nanomaterials.
2004 ◽
Vol 449-452
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pp. 801-804
1973 ◽
Vol 31
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pp. 132-133
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1974 ◽
Vol 32
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pp. 506-507
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