scholarly journals Resolving single Cu nanoparticle oxidation and Kirkendall void formation with in situ plasmonic nanospectroscopy and electrodynamic simulations

Nanoscale ◽  
2019 ◽  
Vol 11 (43) ◽  
pp. 20725-20733 ◽  
Author(s):  
Sara Nilsson ◽  
David Albinsson ◽  
Tomasz J. Antosiewicz ◽  
Joachim Fritzsche ◽  
Christoph Langhammer

Copper nanostructures are ubiquitous in microelectronics and heterogeneous catalysis and their oxidation is a topic of high current interest and broad relevance.

Nanoscale ◽  
2017 ◽  
Vol 9 (34) ◽  
pp. 12573-12589 ◽  
Author(s):  
Mariano D. Susman ◽  
Yishai Feldman ◽  
Tatyana A. Bendikov ◽  
Alexander Vaskevich ◽  
Israel Rubinstein

In situ LSPR measurements establish the role of the nano Kirkendall effect in Cu nanoparticle oxidation.


2021 ◽  
Vol 9 (12) ◽  
pp. 7556-7565
Author(s):  
Guojian Chen ◽  
Yadong Zhang ◽  
Ke Liu ◽  
Xiaoqing Liu ◽  
Lei Wu ◽  
...  

Constructing phenanthroline-based cationic radical porous hybrid polymers as versatile metal-free heterogeneous catalysts for both oxidation of sulfides and CO2 conversion.


2013 ◽  
Vol 52 (10S) ◽  
pp. 10MC06
Author(s):  
Seunghyun Kim ◽  
Yong-Jin Park ◽  
Young-Chang Joo ◽  
Young-Bae Park

2018 ◽  
Vol 33 (2) ◽  
pp. 024002 ◽  
Author(s):  
Vineet Sivadasan ◽  
Stephen Rhead ◽  
David Leadley ◽  
Maksym Myronov

2004 ◽  
Vol 812 ◽  
Author(s):  
Ehrenfried Zschech ◽  
Moritz A. Meyer ◽  
Eckhard Langer

AbstractIn-situ SEM electromigration studies were performed at fully embedded via/line interconnect structures to visualize the time-dependent void evolution in inlaid copper interconnects. Void formation, growth and movement, and consequently interconnect degradation, depend on both interface bonding and copper microstructure. Two phases are distinguished for the electromigration-induced interconnect degradation process: In the first phase, agglomerations of vacancies and voids are formed at interfaces and grain boundaries, and voids move along weak interfaces. In the second phase of the degradation process, they merge into a larger void which subsequently grows into the via and eventually causes the interconnect failure. Void movement along the copper line and void growth in the via are discontinuous processes, whereas their step-like behavior is caused by the copper microstructure. Directed mass transport along inner surfaces depends strongly on the crystallographic orientation of the copper grains. Electromigration lifetime can be drastically increased by changing the copper/capping layer interface. Both an additional CoWP coating and a local copper alloying with aluminum increase the bonding strength of the top interface of the copper interconnect line, and consequently, electromigration-induced mass transport and degradation processes are reduced significantly.


2010 ◽  
Vol 2010 (1) ◽  
pp. 000294-000297 ◽  
Author(s):  
S. H. Kim ◽  
Jin Yu

Ternary Sn-3.5Ag-xFe solders with varying amount of Fe; 0.1, 0.5, 1.0, and 2.0 wt. % were reacted with Cu UBM which was electroplated using SPS additive and characteristics of Kirkendall void formation at the solder joints were investigated. Results indicate that the propensity to form Kirkendall voids at the solder joint decreased with the Fe content. It showed that Fe dissolved in the Cu UBM and reduced the segregation of S atoms to the Cu3Sn/Cu interface, which suppressed the nucleation of Kirkendall voids at the interface.


1986 ◽  
Vol 118 ◽  
pp. 199-211
Author(s):  
Robert L. Millis

Various types of occultations and eclipses offer individuals with access to small telescopes the opportunity to contribute significantly to modern solar system research. In fact, often it is only through the cooperation of several such observers that the desired scientific objectives can be realized. This review discusses three classes of occultations which are of high current interest and which are particularly suitable for investigation with small telescopes.


2020 ◽  
Vol 63 (15-18) ◽  
pp. 1606-1622 ◽  
Author(s):  
Sten V. Lambeets ◽  
Elizabeth J. Kautz ◽  
Mark G. Wirth ◽  
Graham J. Orren ◽  
Arun Devaraj ◽  
...  

AbstractWe report a unique in situ instrument development effort dedicated to studying gas/solid interactions relevant to heterogeneous catalysis and early stages of oxidation of materials via atom probe tomography and microscopy (APM). An in situ reactor cell, similar in concept to other reports, has been developed to expose nanoscale volumes of material to reactive gas environments, in which temperature, pressure, and gas chemistry are well controlled. We demonstrate that the combination of this reactor cell with APM techniques can aid in building a better mechanistic understanding of resultant composition and surface and subsurface structure changes accompanying gas/surface reactions in metal and metal alloy systems through a series of case studies: O2/Rh, O2/Co, and O2/Zircaloy-4. In addition, the basis of a novel operando mode of analysis within an atom probe instrument is also reported. The work presented here supports the implementation of APM techniques dedicated to atomic to near-atomically resolved gas/surface interaction studies of materials broadly relevant to heterogeneous catalysis and oxidation.


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