scholarly journals Real-time direct transmission electron microscopy imaging of phase and morphology transformation from solid indium oxide hydroxide to hollow corundum-type indium oxide nanocrystallites

Nanoscale ◽  
2019 ◽  
Vol 11 (25) ◽  
pp. 12242-12249
Author(s):  
Lukas Schlicker ◽  
Radian Popescu ◽  
Maged F. Bekheet ◽  
Andrew Doran ◽  
Dagmar Gerthsen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Real Time ◽  
Indium Oxide ◽  
Direct Transmission ◽  
Microscopy Imaging ◽  
Oxide Hydroxide ◽  
Transmission Electron ◽  
Hollow Nanostructures

This work clarifies the mechanism of the formation of hollow nanostructures (nanotubes and nanospheres) during the InOOH to rh-In2O3 transformation.

scholarly journals Fabrication of a liquid cell for in situ transmission electron microscopy

Microscopy ◽  
2020 ◽  
Author(s):  
Xiaoguang Li ◽  
Kazutaka Mitsuishi ◽  
Masaki Takeguchi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cost Effective ◽  
Production Method ◽  
Microscopy Imaging ◽  
Transmission Electron ◽  
In Situ Electron Microscopy ◽  
Liquid Cell ◽  
Si Wafer

Abstract Liquid cell transmission electron microscopy (LCTEM) enables imaging of dynamic processes in liquid with high spatial and temporal resolution. The widely used liquid cell (LC) consists of two stacking microchips with a thin wet sample sandwiched between them. The vertically overlapped electron-transparent membrane windows on the microchips provide passage for the electron beam. However, microchips with imprecise dimensions usually cause poor alignment of the windows and difficulty in acquiring high-quality images. In this study, we developed a new and efficient microchip fabrication process for LCTEM with a large viewing area (180 µm × 40 µm) and evaluated the resultant LC. The new positioning reference marks on the surface of the Si wafer dramatically improve the precision of dicing the wafer, making it possible to accurately align the windows on two stacking microchips. The precise alignment led to a liquid thickness of 125.6 nm close to the edge of the viewing area. The performance of our LC was demonstrated by in situ transmission electron microscopy imaging of the dynamic motions of 2-nm Pt particles. This versatile and cost-effective microchip production method can be used to fabricate other types of microchips for in situ electron microscopy.

scholarly journals Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

2010 ◽  
Vol 16 (S2) ◽  
pp. 80-81 ◽  
Author(s):  
SD Findlay ◽  
N Shibata ◽  
H Sawada ◽  
E Okunishi ◽  
Y Kondo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Bright Field ◽  
Microscopy Imaging ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Determination of surface crystallography of faceted nanoparticles using transmission electron microscopy imaging and diffraction modes

2009 ◽  
Vol 42 (3) ◽  
pp. 519-524 ◽  
Author(s):  
Song Li ◽  
Yudong Zhang ◽  
Claude Esling ◽  
Jacques Muller ◽  
Jean-Sébastien Lecomte ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Coordinate System ◽  
Calculation Method ◽  
Microscopy Imaging ◽  
Plane Normal ◽  
Transmission Electron ◽  
Structure Of Nanoparticles ◽  
Normal Vectors

A general calculation method is proposed to characterize the crystalline planes and directions of a faceted nanoparticle using transmission electron microscopy (TEM) imaging and diffraction modes. With the determination of the edge vectors and then the plane normal vectors in the screen coordinate system of TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. The method is helpful for related studies of the determination of the surface structure of nanoparticles.

Transmission Electron Microscopy Imaging of Structural Transformation Dynamics in a Single Nanocrystal

2012 ◽  
Vol 20 (1) ◽  
pp. 18-22
Author(s):  
Haimei Zheng
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Collection Efficiency ◽  
Single Atom ◽  
Microscopy Imaging ◽  
High Brightness ◽  
Rapid Acquisition ◽  
Signal Collection ◽  
Transmission Electron ◽  
Resolution Imaging

Over the last decade, transmission electron microscopy (TEM) has advanced remarkably. With the development of aberration-corrected optics, improved recording systems, high brightness guns, and so on, imaging with single-atom sensitivity across the periodic table has become a reality. Atomic resolution imaging with rapid acquisition and with greater signal collection efficiency opens many opportunities in the study of dynamic processes of materials.

scholarly journals Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans

2018 ◽  
Vol 24 (6) ◽  
pp. 623-633 ◽  
Author(s):  
Xin Li ◽  
Ondrej Dyck ◽  
Sergei V. Kalinin ◽  
Stephen Jesse
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Real Time ◽  
Scanning Transmission Electron Microscopy ◽  
High Speed ◽  
Dynamic Range ◽  
Extended Defects ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractScanning transmission electron microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In recent years, attention has focused on the potential of STEM to explore beam induced chemical processes and especially manipulating atomic motion, enabling atom-by-atom fabrication. These applications, as well as traditional imaging of beam sensitive materials, necessitate increasing the dynamic range of STEM in imaging and manipulation modes, and increasing the absolute scanning speed which can be achieved by combining sparse sensing methods with nonrectangular scanning trajectories. Here we have developed a general method for real-time reconstruction of sparsely sampled images from high-speed, noninvasive and diverse scanning pathways, including spiral scan and Lissajous scan. This approach is demonstrated on both the synthetic data and experimental STEM data on the beam sensitive material graphene. This work opens the door for comprehensive investigation and optimal design of dose efficient scanning strategies and real-time adaptive inference and control of e-beam induced atomic fabrication.

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