scholarly journals Synchrotron hard X-ray chemical imaging of trace element speciation in heterogeneous samples: development of criteria for uncertainty analysis

2020 ◽  
Vol 35 (3) ◽  
pp. 567-579
Author(s):  
Jonas Wielinski ◽  
Francesco Femi Marafatto ◽  
Alexander Gogos ◽  
Andreas Scheidegger ◽  
Andreas Voegelin ◽  
...  

Synthetic datasets with known uncertainty are used to quantify the interpretability of experimental hard X-ray derived chemical images.

2020 ◽  
Vol 105 (1) ◽  
pp. 136-140 ◽  
Author(s):  
Stephen J. Barnes ◽  
David Paterson ◽  
Teresa Ubide ◽  
Louise E. Schoneveld ◽  
Chris Ryan ◽  
...  

Abstract Trace-element zoning in igneous phenocrysts and cumulus phases is an informative record of magmatic evolution. The advent of microbeam X-ray fluorescence (XRF) mapping has allowed rapid chemical imaging of samples at thin section to decimeter scale, revealing such zoning patterns. Mapping with synchrotron radiation using multidetector arrays has proved especially effective, allowing entire thin sections to be imaged at micrometer-scale resolution in a matter of hours. The resolution of subtle minor element zoning, particularly in first-row transition metals, is greatly enhanced in synchrotron X-ray fluorescence microscopy (XFM) images by scanning with input beam energy below the FeKα line. In the examples shown here, from a phenocryst rich trachybasalt from Mt Etna (Italy) and from a Ni-Cu-PGE ore-bearing intrusion at Norilsk (Siberia), the zoning patterns revealed in this way record aspects of the crystallization history that are not readily evident from XFM images collected using higher incident energies and that cannot be obtained at comparable spatial resolutions by any other methods within reasonable scan times. This approach has considerable potential as a geochemical tool for investigating magmatic processes and is also likely to be applicable in a wide variety of other fields.


2003 ◽  
Vol 32 (2) ◽  
pp. 535 ◽  
Author(s):  
B. P. Jackson ◽  
P. M. Bertsch ◽  
M. L. Cabrera ◽  
J. J. Camberato ◽  
J. C. Seaman ◽  
...  

2020 ◽  
Author(s):  
O. V. Gorchakova ◽  
Yu. P. Kolmogorov ◽  
V. N. Gorchakov ◽  
G. A. Demchenko ◽  
S. N. Abdreshov

2021 ◽  
Vol 2 (1) ◽  
Author(s):  
Hiroyuki Yamane ◽  
Masaki Oura ◽  
Osamu Takahashi ◽  
Tomoko Ishihara ◽  
Noriko Yamazaki ◽  
...  

AbstractAdhesion is an interfacial phenomenon that is critical for assembling carbon structural composites for next-generation aircraft and automobiles. However, there is limited understanding of adhesion on the molecular level because of the difficulty in revealing the individual bonding factors. Here, using soft X-ray spectromicroscopy we show the physical and chemical states of an adhesive interface composed of a thermosetting polymer of 4,4’-diaminodiphenylsulfone-cured bisphenol A diglycidyl ether adhered to a thermoplastic polymer of plasma-treated polyetheretherketone. We observe multiscale phenomena in the adhesion mechanisms, including sub-mm complex interface structure, sub-μm distribution of the functional groups, and molecular-level covalent-bond formation. These results provide a benchmark for further research to examine how physical and chemical states correlate with adhesion, and demonstrate that soft X-ray imaging is a promising approach for visualizing the physical and chemical states at adhesive interfaces from the sub-mm level to the molecular level.


2014 ◽  
Vol 43 (2) ◽  
pp. 47-53 ◽  
Author(s):  
Toshio MIYAZAKI ◽  
Shin-ichi YAMASAKI ◽  
Noriyoshi TSUCHIYA ◽  
Satoshi OKUMURA ◽  
Ryoichi YAMADA ◽  
...  

1976 ◽  
Vol 279 (2) ◽  
pp. 160-160 ◽  
Author(s):  
R. Zeisler ◽  
J. Cross ◽  
E. A. Schweikert

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