Charge density distribution in the crystals of N-n-butyltetrachlorophthalimide. Atoms-in-molecules analysis of different types of halogen interactions

CrystEngComm ◽  
2019 ◽  
Vol 21 (46) ◽  
pp. 7048-7056
Author(s):  
Agata Owczarzak ◽  
Grzegorz Dutkiewicz ◽  
Maciej Kubicki
Keyword(s):  
High Resolution ◽  
Density Distribution ◽  
Charge Density ◽  
Diffraction Data ◽  
Atoms In Molecules ◽  
X Ray Diffraction ◽  
Charge Density Distribution ◽  
X Ray ◽  
Different Types

The charge density distribution in N-n-butyltetrachlorophthalimide was experimentally determined using high-resolution X-ray diffraction data and the Hansen–Coppens multipole formalism.

Charge-Density Distribution and Electrostatic Flexibility of ZIF-8 Based on High-Resolution X-ray Diffraction Data and Periodic Calculations

2015 ◽  
Vol 54 (6) ◽  
pp. 2660-2670 ◽  
Author(s):  
Sladjana B. Novaković ◽  
Goran A. Bogdanović ◽  
Christian Heering ◽  
Gamall Makhloufi ◽  
Djordje Francuski ◽  
...  
Keyword(s):  
High Resolution ◽  
Density Distribution ◽  
Charge Density ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Charge Density Distribution ◽  
X Ray ◽  
Periodic Calculations

Electrostatic Properties of Ions in Crystals from X-Ray Diffraction Data

1993 ◽  
Vol 48 (1-2) ◽  
pp. 81-84 ◽  
Author(s):  
Niels K. Hansen
Keyword(s):  
Density Distribution ◽  
Charge Density ◽  
Electrostatic Potential ◽  
Diffraction Data ◽  
Reciprocal Space ◽  
Electrostatic Energy ◽  
X Ray Diffraction ◽  
Charge Density Distribution ◽  
X Ray ◽  
Space Approach

Abstract A procedure for calculating the electrostatic potential and the electrostatic energy of an ion in a crystal is presented. It is based on a mixed direct and reciprocal space approach, and it takes into account the detailed charge density distribution in the crystal which can be obtained from accurate X-ray diffraction measurements.

Charge density distribution in aminomethylphosphonic acid

2010 ◽  
Vol 66 (5) ◽  
pp. 559-567 ◽  
Author(s):  
Rafał Janicki ◽  
Przemysław Starynowicz
Keyword(s):  
Density Distribution ◽  
Charge Density ◽  
Density Functional ◽  
X Ray Diffraction ◽  
Charge Density Distribution ◽  
Functional Theory ◽  
X Ray ◽  
Topological Features ◽  
Aminomethylphosphonic Acid ◽  
Experimental Charge Density

The experimental charge density distribution in aminomethylphosphonic acid has been determined from X-ray diffraction and its topological features have been analyzed. The results have shown that the P—O bonds are highly polarized, moreover the P—OH bond is weaker than the bonds to unprotonated O atoms. These facts have been confirmed by theoretical density functional theory (DFT) calculations, which have shown that the single, strongly polarized bonds within the phosphonate group are modified by hyperconjugation effects.

scholarly journals Experimental and theoretical charge density distribution in Pigment Yellow 101

2015 ◽  
Vol 17 (6) ◽  
pp. 4677-4686 ◽  
Author(s):  
Jonathan J. Du ◽  
Linda Váradi ◽  
Jinlong Tan ◽  
Yiliang Zhao ◽  
Paul W. Groundwater ◽  
...  
Keyword(s):  
Density Functional Theory ◽  
Density Distribution ◽  
Charge Density ◽  
Density Functional ◽  
Density Functional Theory Calculations ◽  
X Ray Diffraction ◽  
Charge Density Distribution ◽  
Functional Theory ◽  
X Ray ◽  
Multipole Refinement

The charge density distribution in 2,2′-dihydroxy-1,1′-naphthalazine (Pigment Yellow 101; P.Y.101) has been determined using high-resolution X-ray diffraction and multipole refinement, along with density functional theory calculations.

Effect of sintering temperature on the magnetic properties and charge density distribution of nano-NiO

2014 ◽  
Vol 68 (6) ◽  
Author(s):  
Subramanian Saravanakumar ◽  
Ramachandran Saravanan ◽  
Subramanian Sasikumar
Keyword(s):  
Density Distribution ◽  
Charge Density ◽  
Electron Density ◽  
Electron Density Distribution ◽  
Sintering Temperature ◽  
Precipitation Method ◽  
X Ray Diffraction ◽  
Charge Density Distribution ◽  
X Ray ◽  
Distribution Studies

AbstractPhase pure nano nickel oxide was synthesized by the chemical precipitation method and sintered at 200°C, 400°C and 600°C, respectively, to study the effect of sintering on the charge distribution and magnetism. The samples were analyzed by X-ray diffraction for electron density distribution studies, vibrating sample magnetometry for magnetic behavior and by UV-VIS spectrophotometry for optical characteristics. Rearrangement of charge density distribution with respect to sintering temperature was analyzed through the maximum entropy method employed using powder X-ray diffraction data. The observed magnetic transition with respect to the temperature/size effect was analyzed and correlated with electron density distribution studies.

Distribution and Topology of the Electron Density in an Aluminosilicate Compound from High-Resolution X-ray Diffraction Data: the Case of Scolecite

1998 ◽  
Vol 54 (6) ◽  
pp. 819-833 ◽  
Author(s):  
S. Kuntzinger ◽  
N. E. Ghermani ◽  
Y. Dusausoy ◽  
C. Lecomte
Keyword(s):  
High Resolution ◽  
Density Distribution ◽  
Electron Density ◽  
Critical Points ◽  
Diffraction Data ◽  
Electron Density Distribution ◽  
X Ray Diffraction ◽  
X Ray ◽  
And Topology ◽  
Experimental Electron Density

The experimental electron density distribution in scolecite, CaAl2Si3O10.3H2O, has been derived from single-crystal high-resolution Ag Kα X-ray diffraction data. A statistical method based on the prediction matrix has been used to discuss the estimation of the valence populations (P val) in the kappa least-squares refinements. The densities on the Si—O—Si and Si—O—Al bridges have been characterized using the topology of the electron density through its Laplacian at the bond critical points. The Si—O and Al—O bond features are related to the atomic environment and to the Si—O—T geometries (T = Si, Al).

Insight into the Electron Density Distribution in an O,N-Heterocyclic Stannylene by High-Resolution X-ray Diffraction Analysis

2019 ◽  
Vol 2019 (6) ◽  
pp. 875-884 ◽  
Author(s):  
Maxim G. Chegerev ◽  
Alexandr V. Piskunov ◽  
Kseniya V. Tsys ◽  
Andrey G. Starikov ◽  
Klaus Jurkschat ◽  
...  
Keyword(s):  
High Resolution ◽  
Density Distribution ◽  
Diffraction Analysis ◽  
Electron Density ◽  
Electron Density Distribution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Insight Into
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