Comparative study on in situ surface cleaning effect of intrinsic oxide-covering GaAs surface using TMA precursor and Al2O3 buffer layer for HfGdO gate dielectrics
2018 ◽
Vol 6
(10)
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pp. 2546-2555
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In this work, comparative study on the cleaning effect of the intrinsic oxide covering GaAs surface using TMA precursor and Al2O3 buffer layer were performed.
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2000 ◽
Vol 5
(3)
◽
pp. 209-220
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2004 ◽
Vol 210
(1-2)
◽
pp. 105-117
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