Bimodal atomic force microscopy for the characterization of thiolated self-assembled monolayers

Nanoscale ◽  
2018 ◽  
Vol 10 (48) ◽  
pp. 23027-23036 ◽  
Author(s):  
Evangelia-Nefeli Athanasopoulou ◽  
Nikolaos Nianias ◽  
Quy Khac Ong ◽  
Francesco Stellacci
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Depth Analysis ◽  
Assembled Monolayers ◽  
Self Assembled

In-depth analysis of self-assembled monolayers by bimodal atomic force microscopy.

Structural Characterization of Self-Assembled Monolayers of Neoglycoconjugates Using Atomic Force Microscopy

Langmuir ◽  
2005 ◽  
Vol 21 (14) ◽  
pp. 6142-6144 ◽  
Author(s):  
Christophe Tromas ◽  
Peter Eaton ◽  
Jean Mimault ◽  
Javier Rojo ◽  
Soledad Penadés
Keyword(s):  
Atomic Force Microscopy ◽  
Structural Characterization ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

Self-assembled monolayers of sulfonate-terminated alkanethiols investigated by frequency modulation atomic force microscopy in liquid

2017 ◽  
Vol 28 (45) ◽  
pp. 455603 ◽  
Author(s):  
Hitoshi Asakawa ◽  
Natsumi Inada ◽  
Kaito Hirata ◽  
Sayaka Matsui ◽  
Takumi Igarashi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

Mechanical Properties of Oligothiophene Self Assembled Films by Atomic Force Microscopy.

2005 ◽  
Vol 871 ◽  
Author(s):  
Imma Ratera ◽  
Jinyu Chen ◽  
Amanda Murphy ◽  
Frank Ogletree ◽  
Jean M. J. Fréchet ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Cell Dimensions ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Unit Cell Dimensions

AbstractThe oligothiophene derivative (4-(5″″-tetradecyl-[2,2′;5′,2″;5″,2″′;5″′,2″″] pentathiophen-5-yl)-butyric acid (C14-5TBA) was synthesized and the structural and mechanical properties of self-assembled monolayers on mica have been studied by atomic force microscopy (AFM). The films were prepared by drop casting a dilute THF solution (1mM) of the oligothiphene on mica. Islands containing primarily monolayers with a very small percentage of multilayers were formed. The molecules adsorb through the carboxylic group, and expose the alkyl chain (CH2)13CH3. High resolution AFM scans reveal a well ordered structure of molecules with unit cell dimensions of 0.65 and 0.46 nm. Applying load to the tip, the molecular film was gradually compressed from an initial height of 4.1nm to a final one of 2.6 nm, corresponding to atilt of the alkyl chains. In regions covered with bilayers the molecules in the second layer were oriented opposite to those in the first layer, thus exposing the carboxylic end group to the air. These second layer was easily removed as the tip pressure increased.

Lattice Structure of Self-Assembled Monolayers of Dialkyl Sulfides and Calix[4]arene Sulfide Adsorbates on Au(111) Revealed by Atomic Force Microscopy

Langmuir ◽  
1999 ◽  
Vol 15 (17) ◽  
pp. 5541-5546 ◽  
Author(s):  
Holger Schönherr ◽  
G. Julius Vancso ◽  
Bart-Hendrik Huisman ◽  
Frank C. J. M. van Veggel ◽  
David N. Reinhoudt
Keyword(s):  
Atomic Force Microscopy ◽  
Lattice Structure ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled ◽  
Dialkyl Sulfides

scholarly journals Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy

1999 ◽  
Vol 14 (9) ◽  
pp. 3725-3733 ◽  
Author(s):  
A. Fischer ◽  
F. C. Jentoft ◽  
G. Weinberg ◽  
R. Schlögl ◽  
T. P. Niesen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Sulfonic Acid ◽  
Homogeneous Nucleation ◽  
Chemical Deposition ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Scanning Electron

Oxidic zirconium films prepared by chemical deposition from aqueous medium on sulfonic acid terminated self-assembled monolayers attached to an oxidized silicon surface were investigated with scanning electron microscopy and atomic force microscopy. Bulk precipitate forms in the 4 mM Zr(SO4)2 · 4H2O, 0.4 N HCl deposition medium at 343 K after approximately 30 min. Precipitate particles (200 nm and larger) were found embedded in the oxidic zirconium film and adsorbed on top of the film; they could be washed off, but patches of the film were removed. Working with unstable deposition solutions, in which homogeneous nucleation occurs, leads to preparation-inherent flaws in the film.

Self-Assembled Monolayers of Alkanethiol and Fluoroalkanethiol Investigated by Noncontact Atomic Force Microscopy

2005 ◽  
Vol 44 (7B) ◽  
pp. 5378-5381 ◽  
Author(s):  
Takashi Ichii ◽  
Masashi Urabe ◽  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled
Sign in / Sign up

Export Citation Format

Share Document