scholarly journals Focused ion beam milling of self-assembled magnetic superstructures: an approach to fabricate nanoporous materials with tunable porosity

2018 ◽  
Vol 5 (6) ◽  
pp. 1211-1218 ◽  
Author(s):  
Verner Håkonsen ◽  
Gurvinder Singh ◽  
Jianying He ◽  
Zhiliang Zhang
Keyword(s):  
Porous Materials ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Nanoporous Materials ◽  
Porous Network ◽  
Novel Approach ◽  
Self Assembled ◽  
Focused Ion Beam Milling

Focused ion beam milling of self-assembled magnetic superstructures is demonstrated as a novel approach to fabricate porous materials with tunable porosity. During exposure to the ion beam, nanoparticles in the superstructure are subjected to combined milling and melting, thus merging together into a porous network.

scholarly journals Correction: Focused ion beam milling of self-assembled magnetic superstructures: an approach to fabricate nanoporous materials with tunable porosity

2019 ◽  
Vol 6 (2) ◽  
pp. 412-413
Author(s):  
Verner Håkonsen ◽  
Gurvinder Singh ◽  
Jianying He ◽  
Zhiliang Zhang
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Nanoporous Materials ◽  
Self Assembled ◽  
Focused Ion Beam Milling

Correction for ‘Focused ion beam milling of self-assembled magnetic superstructures: an approach to fabricate nanoporous materials with tunable porosity’ by Verner Håkonsen et al., Mater. Horiz., 2018, 5, 1211–1218.

Characterisation of nanoporous materials using Focused Ion Beam milling method

2012 ◽  
Author(s):  
Sahand Chitsaz Charandabi ◽  
Aydin Sabouri ◽  
Hossein Ostadi ◽  
Carl J. Anthony ◽  
Philip D. Prewett
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Nanoporous Materials ◽  
Milling Method ◽  
Focused Ion Beam Milling

Focused-ion-beam Milling: A Novel Approach to Probing the Interior of Particles Used for Inhalation Aerosols

2007 ◽  
Vol 24 (9) ◽  
pp. 1608-1617 ◽  
Author(s):  
Desmond Heng ◽  
Patricia Tang ◽  
Julie M. Cairney ◽  
Hak-Kim Chan ◽  
David J. Cutler ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Novel Approach ◽  
Focused Ion Beam Milling

Focused ion beam milling of nanocavities in single colloidal particles and self-assembled opals

2006 ◽  
Vol 17 (23) ◽  
pp. 5717-5721 ◽  
Author(s):  
Léon A Woldering ◽  
A M (Bert) Otter ◽  
Bart H Husken ◽  
Willem L Vos
Keyword(s):  
Focused Ion Beam ◽  
Colloidal Particles ◽  
Ion Beam ◽  
Self Assembled ◽  
Focused Ion Beam Milling

Novel Approach of Improving Secondary Electron Detector in FIB System

2018 ◽  
Author(s):  
Steve Wang ◽  
Jim McGinn ◽  
Peter Tvarozek ◽  
Amir Weiss
Keyword(s):  
Integrated Circuit ◽  
Secondary Electron ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Vital Role ◽  
Electron Detector ◽  
System A ◽  
Novel Approach

Abstract Secondary electron detector (SED) plays a vital role in a focused ion beam (FIB) system. A successful circuit edit requires a good effective detector. Novel approach is presented in this paper to improve the performance of such a detector, making circuit altering for the most advanced integrated circuit (IC) possible.

scholarly journals A streamlined workflow for automated cryo focused ion beam milling

2021 ◽  
pp. 107743
Author(s):  
Sebastian Tacke ◽  
Philipp Erdmann ◽  
Zhexin Wang ◽  
Sven Klumpe ◽  
Michael Grange ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

Addressable Metal-Ferroelectric-Metal Nanocapacitor Arrays Fabricated by Focused Ion Beam Milling

2012 ◽  
Vol 132 (1) ◽  
pp. 99-106
Author(s):  
Ying Dai ◽  
Lei Yang ◽  
Longhai Wang ◽  
Bin Tian ◽  
Lianying Zou ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

A study of angular effects in focused ion beam milling of water ice

2008 ◽  
Vol 18 (9) ◽  
pp. 095010 ◽  
Author(s):  
Jing Fu ◽  
Sanjay B Joshi ◽  
Jeffrey M Catchmark
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Water Ice ◽  
Focused Ion Beam Milling

Properties of Individually Addressable Ferroelectric Nanocapacitor Arrays Fabricated by Focused Ion Beam Milling

2013 ◽  
Vol 13 (8) ◽  
pp. 5542-5546 ◽  
Author(s):  
Ying Dai ◽  
Lei Yang ◽  
Longhai Wang ◽  
Lianying Zou ◽  
Bin Tian ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling
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