Reconstructing stochastic attractors from nanoscale experiments on a non-equilibrium reaction

Cédric Barroo; Valérie Voorsluijs; Thierry Visart de Bocarmé; Pierre Gaspard; Yannick De Decker

doi:10.1039/c8cp02547a

Reconstructing stochastic attractors from nanoscale experiments on a non-equilibrium reaction

Physical Chemistry Chemical Physics ◽

10.1039/c8cp02547a ◽

2018 ◽

Vol 20 (33) ◽

pp. 21302-21312 ◽

Cited By ~ 2

Author(s):

Cédric Barroo ◽

Valérie Voorsluijs ◽

Thierry Visart de Bocarmé ◽

Pierre Gaspard ◽

Yannick De Decker

Keyword(s):

Experimental Evidence ◽

Field Emission ◽

Stochastic Simulations ◽

Equilibrium Reaction ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Non Equilibrium

Field emission microscopy and stochastic simulations prove the first experimental evidence of the existence of stochastic attractor at the nanoscale.

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Field-emission microscopy

AccessScience ◽

10.1036/1097-8542.256210 ◽

2015 ◽

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy

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Preliminary study of KCl by field-emission microscopy

Surface Science ◽

10.1016/0039-6028(71)90194-4 ◽

1971 ◽

Vol 27 (3) ◽

pp. 635-644 ◽

Cited By ~ 8

Author(s):

Fumio Okuyama

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Preliminary Study ◽

Emission Microscopy

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Field emission microscopy study of silver adsorption on tungsten single-crystal planes

Thin Solid Films ◽

10.1016/0040-6090(82)90459-x ◽

1982 ◽

Vol 97 (3) ◽

pp. 245-257 ◽

Cited By ~ 2

Author(s):

Cr. Conţescu ◽

M.I. Vass

Keyword(s):

Single Crystal ◽

Field Emission ◽

Microscopy Study ◽

Tungsten Single Crystal ◽

Field Emission Microscopy ◽

Emission Microscopy

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Field emission microscopy study of surface self diffusion and crystal growth of refractory metals in high electric fields

Vacuum ◽

10.1016/0042-207x(86)90343-x ◽

1986 ◽

Vol 36 (10) ◽

pp. 701

Keyword(s):

Crystal Growth ◽

Field Emission ◽

Electric Fields ◽

Microscopy Study ◽

Refractory Metals ◽

Self Diffusion ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

High Electric Fields

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Scanning Field Emission Microscopy with Spin and Energy Analysis

10.1109/ivnc52431.2021.9600781 ◽

2021 ◽

Cited By ~ 1

Author(s):

A-K Thamm ◽

J. Wei ◽

M. Demydenko ◽

C. G. H. Walker ◽

D. Pescia ◽

...

Keyword(s):

Field Emission ◽

Energy Analysis ◽

Field Emission Microscopy ◽

Emission Microscopy

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Collector dependence of field emission in the Scanning Field Emission Microscopy

10.1109/ivnc52431.2021.9600714 ◽

2021 ◽

Author(s):

H. J. Gotsis ◽

N. C. Bacalis ◽

J. P. Xanthakis

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy

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Field emission microscopy of carbon nanotube fibers: Evaluating and interpreting spatial emission

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.5140602 ◽

2020 ◽

Vol 38 (2) ◽

pp. 024006 ◽

Cited By ~ 1

Author(s):

Taha Y. Posos ◽

Steven B. Fairchild ◽

Jeongho Park ◽

Sergey V. Baryshev

Keyword(s):

Carbon Nanotube ◽

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Carbon Nanotube Fibers

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Field Desorption by Alternating Fields. An Improved Technique for Field Emission Microscopy

Review of Scientific Instruments ◽

10.1063/1.1716183 ◽

1958 ◽

Vol 29 (4) ◽

pp. 309-312 ◽

Cited By ~ 31

Author(s):

Earl C. Cooper ◽

Erwin W. Müller

Keyword(s):

Field Emission ◽

Field Desorption ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Improved Technique

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A STUDY OF FIELD EMISSION OF SINGLE-WALLED CARBONNANOTUBES USING FIELD EMISSION MICROSCOPY

Acta Physica Sinica ◽

10.7498/aps.50.1805 ◽

2001 ◽

Vol 50 (9) ◽

pp. 1805

Author(s):

SUN JIAN-PING ◽

ZHANG ZHAO-XIANG ◽

HOU SHI-MIN ◽

ZHAO XING-YU ◽

SHI ZU-JIN ◽

...

Keyword(s):

Field Emission ◽

Field Emission Microscopy ◽

Emission Microscopy

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Investigation of Electron Transport Across Vertically Grown CNTs Using Combination of Proximity Field Emission Microscopy and Scanning Probe Image Processing Techniques

Electronic Materials Letters ◽

10.1007/s13391-018-0009-2 ◽

2018 ◽

Vol 14 (2) ◽

pp. 173-180 ◽

Cited By ~ 2

Author(s):

Sadhu Kolekar ◽

Shashikant P. Patole ◽

Ji-Beom Yoo ◽

Chandrakant V. Dharmadhikari

Keyword(s):

Image Processing ◽

Electron Transport ◽

Field Emission ◽

Scanning Probe ◽

Image Processing Techniques ◽

Field Emission Microscopy ◽

Emission Microscopy ◽

Processing Techniques

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