scholarly journals The thermal boundary resistance at semiconductor interfaces: a critical appraisal of the Onsager vs. Kapitza formalisms

2018 ◽  
Vol 20 (35) ◽  
pp. 22623-22628
Author(s):  
Riccardo Rurali ◽  
Xavier Cartoixà ◽  
Dick Bedeaux ◽  
Signe Kjelstrup ◽  
Luciano Colombo

We critically readdress the definition of thermal boundary resistance at an interface between two semiconductors.

Author(s):  
E. S. Landry ◽  
T. Matsuura ◽  
A. J. H. McGaughey

Phonon scattering at an interface between two materials results in a thermal boundary resistance R, given by [1] R=ΔTq,(1) where ΔT and q are the temperature drop and heat flux across the interface. Predicting the thermal boundary resistance of semiconductor/semiconductor interfaces is important in devices where phonon interface scattering is a significant contributor to the overall thermal resistance (e.g., computer chips with high component density). Such predictions will also lead to improvements in the design of nanocomposite materials (e.g., superlattices) with low thermal conductivity, desirable in thermoelectric energy conversion applications [2].


2018 ◽  
Author(s):  
Young Gwan Choi ◽  
Chan June Zhung ◽  
Chang Jae Roh ◽  
Hwi In Ju ◽  
Tae Yun Kim ◽  
...  

Author(s):  
Christopher M. Stanley ◽  
Benjamin K. Rader ◽  
Braxton H. D. Laster ◽  
Mahsa Servati ◽  
Stefan K. Estreicher

2015 ◽  
Vol 107 (8) ◽  
pp. 084103 ◽  
Author(s):  
M. Tovar-Padilla ◽  
L. Licea-Jimenez ◽  
S. A. Pérez-Garcia ◽  
J. Alvarez-Quintana

2021 ◽  
Vol 218 (23) ◽  
pp. 2170063
Author(s):  
Christopher M. Stanley ◽  
Benjamin K. Rader ◽  
Braxton H. D. Laster ◽  
Mahsa Servati ◽  
Stefan K. Estreicher

1973 ◽  
Vol 11 (5-6) ◽  
pp. 639-665 ◽  
Author(s):  
R. E. Peterson ◽  
A. C. Anderson

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