scholarly journals Deformation and failure mechanisms of electrochemically lithiated silicon thin films

RSC Advances ◽  
2017 ◽  
Vol 7 (22) ◽  
pp. 13487-13497 ◽  
Author(s):  
Hansinee Sitinamaluwa ◽  
Jawahar Nerkar ◽  
Mingchao Wang ◽  
Shanqing Zhang ◽  
Cheng Yan

A fundamental understanding of mechanical behavior of a Li–Si system is necessary to address the poor mechanical integrity of amorphous silicon (a-Si) electrodes, in order to utilize their enormous capacity in Li-ion batteries.

2007 ◽  
Vol 9 (4) ◽  
pp. 796-800 ◽  
Author(s):  
V. Baranchugov ◽  
E. Markevich ◽  
E. Pollak ◽  
G. Salitra ◽  
D. Aurbach

2019 ◽  
Vol 1 (1) ◽  
pp. 70-76 ◽  
Author(s):  
Hansinee S. Sitinamaluwa ◽  
Henan Li ◽  
Kimal C. Wasalathilake ◽  
Annalena Wolff ◽  
Tuquabo Tesfamichael ◽  
...  

2020 ◽  
Vol 19 ◽  
pp. 100462
Author(s):  
Jiddhu M. Chethodil ◽  
Binitha Gangaja ◽  
Shantikumar Nair ◽  
Dhamodaran Santhanagopalan

2015 ◽  
Vol 64 (22) ◽  
pp. 107-111 ◽  
Author(s):  
A. Ulvestad ◽  
J. P. Maehlen ◽  
M. Kirkengen

2013 ◽  
Vol 97 ◽  
pp. 37-39 ◽  
Author(s):  
Jun Wang ◽  
Yongfeng Tong ◽  
Zhuang Xu ◽  
Weihua Li ◽  
Pengxun Yan ◽  
...  

2020 ◽  
Vol 2 (3) ◽  
Author(s):  
Lukas Terkowski ◽  
Iain W. Martin ◽  
Daniel Axmann ◽  
Malte Behrendsen ◽  
Felix Pein ◽  
...  

2020 ◽  
Vol 984 ◽  
pp. 91-96
Author(s):  
Cheng Liu ◽  
Yu Hao Song ◽  
Dong Yang Li ◽  
Wei Li

The structural and optical properties of amorphous silicon (a-Si) and Al-dispersed amorphous silicon (a-Si:Al) thin films irradiated by femtosecond (fs) laser at various energy densities are investigated comparatively in this article. It is found that there is an uneven crystallization in both amorphous thin films by means of optical microscopy and laser Raman spectroscopy respectively. The crystallization in each pulse spot area is gradually weakened from the center to the edge along with the energy dispersion of laser irradiation. The laser induced crystallization in a-Si thin films begins early and develops more extensively compared to that in a-Si:Al thin films, and Al nanoparticles inhibit somehow the crystallization of a-Si in a-Si:Al thin films.


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