Critical strain for Sn incorporation into spontaneously graded Ge/GeSn core/shell nanowires
Keyword(s):
Quantitative estimation by measurements and simulations of the critical strain for Sn incorporation into graded Ge/GeSn core/shell nanowires, due to progressive strain relaxation with increasing shell thickness.
2013 ◽
Vol 555
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pp. 213-218
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Keyword(s):
2013 ◽
Vol 61
(11)
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pp. 2147-2160
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Keyword(s):
2016 ◽
Vol 222
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pp. 249-256
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