Insight on the silver catalyst distribution during silicon nanowire array formation: an X-ray reflectivity study
Keyword(s):
X Ray
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The metal catalyst depth distribution is determined for the first time in etched Si nanowire arrays using X-ray reflectivity.
2019 ◽
Vol 7
(12)
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pp. 6730-6739
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Keyword(s):
2015 ◽
Vol 162
(10)
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pp. B264-B268
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