Quantifying small changes in uranium oxidation states using XPS of a shallow core level

2017 ◽  
Vol 19 (45) ◽  
pp. 30473-30480 ◽  
Author(s):  
Eugene S. Ilton ◽  
Yingge Du ◽  
Joanne E. Stubbs ◽  
Peter J. Eng ◽  
Anne M. Chaka ◽  
...  

Quantification of U(iv), U(v), and U(vi) in UO2+x using the 5d XPS.

1992 ◽  
Vol 283 ◽  
Author(s):  
Hisao Nakashima ◽  
Koichi Inoue ◽  
Kenzo Maehashi

ABSTRACTSi2p core level absorption and photoemission spectra are taken for different porous Si layers using synchrotron radiation, toknow the electronic structures of porous Si. The core level absorption spectra show the high energy shift of the conduction band which correlates with the photo-luminescence blue shift. The oxidation states of porous Si are clarified from the photoemission spectra.


2009 ◽  
Vol 96 (8) ◽  
pp. 963-974 ◽  
Author(s):  
Kay Grossmann ◽  
Thuro Arnold ◽  
Robin Steudtner ◽  
Stefan Weiss ◽  
Gert Bernhard

1998 ◽  
Vol 4 (S2) ◽  
pp. 586-587
Author(s):  
Lindsay P. Keller ◽  
John P. Bradley

EELS is a powerful analytical tool for exploring the local solid state environment in materials. There is an extensive literature on EELS analysis of the transition elements and light elements, yet few EELS data exist for heavy elements with multiple oxidation states. We report here on EELS studies of oxidation state influences on near-edge structure in cerium and uranium compounds.All materials analyzed for this study were embedded in low viscosity epoxy and TEM specimens prepared using ultramicrotomy. The thin sections (∼50 nm thick) were analyzed using a JEOL 2010 (200kV) TEM operated with a LaB6 filament and equipped with a GAT AN 666 parallel EELS spectrometer. EELS data were collected in image mode at 105X magnification with a collection semi-angle of ∼ 100 milliradians at a dispersion of 0.1 eV/channel. The full width at half maximum of the raw (unprocessed) zero-loss peak was 0.7 eV. Peak positions were calibrated by applying a known voltage to a drift tube.


2013 ◽  
Vol 124 ◽  
pp. 141-146 ◽  
Author(s):  
I. Pidchenko ◽  
S. Salminen-Paatero ◽  
J. Rothe ◽  
J. Suksi

1984 ◽  
Vol 30 (12) ◽  
pp. 7236-7241 ◽  
Author(s):  
F. J. Himpsel ◽  
J. F. Morar ◽  
F. R. McFeely ◽  
R. A. Pollak ◽  
Guy Hollinger

1976 ◽  
Vol 37 (19) ◽  
pp. 1282-1285 ◽  
Author(s):  
S. A. Flodstrom ◽  
R. Z. Bachrach ◽  
R. S. Bauer ◽  
S. B. M. Hagström

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