The low-temperature dynamic crossover in the dielectric relaxation of ice Ih
2017 ◽
Vol 19
(42)
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pp. 28610-28620
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Keyword(s):
Based on the idea of defect migration as the principal mechanism in the dielectric relaxation of ice Ih, the concept of low-temperature dynamic crossover was proposed.
2008 ◽
Vol 112
(6)
◽
pp. 1571-1575
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Keyword(s):
Keyword(s):
Keyword(s):
1997 ◽
Vol 211
(3)
◽
pp. 237-249
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2015 ◽
Vol 233-234
◽
pp. 20-24
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Keyword(s):
2010 ◽
Vol 285
(50)
◽
pp. 38978-38986
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