Charge transfer quantification in a SnOx/CuPc semiconductor heterostructure: investigation of buried interface energy structure by photoelectron spectroscopies
2017 ◽
Vol 19
(19)
◽
pp. 11816-11824
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Keyword(s):
The interfacial electronic properties of the tin oxide/copper phthalocyanine layer stack were investigated with two complementary photoemission methods.
2008 ◽
Vol 112
(16)
◽
pp. 6509-6514
◽
2008 ◽
Vol 313-314
◽
pp. 625-629
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Keyword(s):
2015 ◽
Vol 54
(8S1)
◽
pp. 08KF06
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