Microstructural, electrical and carrier transport properties of Au/NiO/n-GaN heterojunction with a nickel oxide interlayer
Keyword(s):
Nickel oxide (NiO) films are prepared on n-type GaN by an e-beam evaporation technique and its structural and chemical characteristics analysed by XRD, TEM and XPS measurements first at room temperature.
2002 ◽
Vol 37
(10)
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pp. 1104-1112
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2017 ◽
Vol 52
(13)
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pp. 8119-8131
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Keyword(s):
2018 ◽
Vol 215
(22)
◽
pp. 1800333
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Keyword(s):