Control of resistive switching behaviors of solution-processed HfOX-based resistive switching memory devices by n-type doping
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In this study, we investigated the effect of Ni and Ta doping on resistive switching behaviors of solution-processed HfOX-based resistive switching memory (RRAM) devices.
2012 ◽
Vol 97
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pp. 122-125
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2020 ◽
Vol 67
(12)
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pp. 5484-5489
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2019 ◽
Vol 45
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pp. 5724-5730
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2018 ◽
Vol 52
(7)
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pp. 075103
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2017 ◽
Vol 32
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pp. 025009
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