Synthesis of bright red-emissive dicyanoetheno-bridged hexa-peri-hexabenzocoronene dimers

2017 ◽  
Vol 15 (6) ◽  
pp. 1426-1434 ◽  
Author(s):  
Kazuma Oda ◽  
Satoru Hiroto ◽  
Ichiro Hisaki ◽  
Hiroshi Shinokubo
Keyword(s):  
Electronic Structure ◽  
Emission Properties ◽  
Large Perturbation

The introduction of a dicyanomethyl anion group to hexa-peri-hexabenzocoronene (HBC) substantially enhanced the emission properties of HBC due to a large perturbation of its electronic structure.

Electronic Structure and Field‐Emission Properties of Nitrogen‐Doped Carbon Nanotubes

2006 ◽  
Vol 14 (2-3) ◽  
pp. 151-164 ◽  
Author(s):  
A. V. Okotrub ◽  
L. G. Bulusheva ◽  
V. V. Belavin ◽  
A. G. Kudashov ◽  
A. V. Gusel'nikov ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electronic Structure ◽  
Field Emission ◽  
Emission Properties ◽  
Nitrogen Doped ◽  
Field Emission Properties ◽  
Nitrogen Doped Carbon

Theory, electronic structure and physical chemistry of materials cathodes for microwave devices

2020 ◽  
Author(s):  
Vladimir Kapustin ◽  
Illarion Li
Keyword(s):  
Physical Chemistry ◽  
Electronic Structure ◽  
Kinetic Theory ◽  
Cathode Materials ◽  
Analytical Methods ◽  
Electronic Materials ◽  
Electronic Devices ◽  
Cold Start ◽  
Emission Properties ◽  
Oxide Phases

In the monograph the kinetic theory of cathode materials based on metal and oxide phases, analytical methods of research of the cathodes, methods of study of their emission properties. Details the authors discuss the theory and physico-chemistry of oxide-Nickel, metalloplastic, and metal alloyed oxide-yttrium cathodes, including a cathode for magnetrons with cold start. Designed for scientific and engineering-technical workers, specializing in electronic materials and electronic devices.

Effect of Microimpurities on the Electronic Structure and Emission Properties of Microwave Device Cathode Materials

2019 ◽  
Vol 10 (5) ◽  
pp. 1065-1071
Author(s):  
V. I. Kapustin ◽  
I. P. Li ◽  
A. V. Shumanov ◽  
S. O. Moskalenko ◽  
V. I. Svitov
Keyword(s):  
Electronic Structure ◽  
Cathode Materials ◽  
Microwave Device ◽  
Emission Properties

Theoretical investigation of electronic structure and field emission properties of carbon nanotube–ZnO nanocontacts

Carbon ◽  
2011 ◽  
Vol 49 (12) ◽  
pp. 3835-3841 ◽  
Author(s):  
Shengli Zhang ◽  
Yonghong Zhang ◽  
Shiping Huang ◽  
Hui Liu ◽  
Peng Wang ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Carbon Nanotube ◽  
Field Emission ◽  
Theoretical Investigation ◽  
Emission Properties ◽  
Field Emission Properties

EELS Measurement of the Local Electronic Structure of Copper Atoms Segregated to Aluminum Grain Boundaries

1996 ◽  
Vol 54 ◽  
pp. 342-343
Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg
Keyword(s):  
Electronic Structure ◽  
Grain Boundaries ◽  
Boundary Segregation ◽  
Thin Layers ◽  
Nominal Composition ◽  
Spatially Resolved ◽  
Service Lifetime ◽  
Heat Treated ◽  
Probe Size ◽  
Local Electronic Structure

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.

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