High-sensitivity imaging with lateral resonance mode atomic force microscopy

Nanoscale ◽  
2016 ◽  
Vol 8 (43) ◽  
pp. 18421-18427 ◽  
Author(s):  
Ren-Feng Ding ◽  
Chih-Wen Yang ◽  
Kuang-Yuh Huang ◽  
Ing-Shouh Hwang
Keyword(s):  
Atomic Force Microscopy ◽  
High Sensitivity ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lateral Resonance ◽  
Mode Atomic Force Microscopy

Torsional resonance mode atomic force microscopy in liquid with Lorentz force actuation

2013 ◽  
Vol 24 (30) ◽  
pp. 305702 ◽  
Author(s):  
Chih-Wen Yang ◽  
Ren-Feng Ding ◽  
Shih-Hsiu Lai ◽  
Hsien-Shun Liao ◽  
Wei-Chiao Lai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Lorentz Force ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Frequency modulated torsional resonance mode atomic force microscopy on polymers

2008 ◽  
Vol 92 (14) ◽  
pp. 143103 ◽  
Author(s):  
Ayhan Yurtsever ◽  
Alexander M. Gigler ◽  
Christian Dietz ◽  
Robert W. Stark
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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