scholarly journals The light–matter interaction of a single semiconducting AlGaN nanowire and noble metal Au nanoparticles in the sub-diffraction limit

2016 ◽  
Vol 18 (34) ◽  
pp. 23680-23685 ◽  
Author(s):  
A. K. Sivadasan ◽  
Kishore K. Madapu ◽  
Sandip Dhara
Keyword(s):  
Noble Metal ◽  
Au Nanoparticles ◽  
Near Field ◽  
Diffraction Limit ◽  
Metal Nanostructures ◽  
Intrinsic Properties ◽  
Matter Interaction ◽  
Light Matter Interaction ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near field scanning optical microscopy is used for imaging as well as understanding the intrinsic properties of semiconducting and noble-metal nanostructures of sub-diffraction size.

Near-Field Scanning Optical Microscopy for Through-Silicon Imaging and Fault Isolation of Integrated Circuits

2014 ◽  
Author(s):  
R. Giridharagopal ◽  
T.M. Eiles ◽  
B. Niu
Keyword(s):  
Optical Microscopy ◽  
Integrated Circuit ◽  
Near Field ◽  
Diffraction Limit ◽  
Fault Isolation ◽  
Lateral Resolution ◽  
Excitation Wavelength ◽  
Process Technology ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Abstract We present the first known images acquired using near-field scanning optical microscopy (NSOM) through backside silicon on functional integrated circuit samples with higher resolution than conventional fault isolation (FI) tools. NSOM offers the possibility of substantially-improved lateral resolution independent of excitation wavelength. Current FI techniques have challenged the resolution limits of conventional optics technology, even in the best solid immersion lens (SIL) to date. This poses a problem for future process technology nodes. This resolution barrier is a by-product of the diffraction limit. In Fourier terms, a conventional lens filters out highfrequency information and thus limits the resolution. In NSOM, by placing a tip with an aperture in extreme proximity to the surface it is possible to capture the near-field light that contains high-frequency information, thereby circumventing the diffraction limit. The tangible benefit is that the resolution is substantially improved. We show that NSOM can be used in backside subsurface imaging of silicon, mirroring the paradigm used in typical optical FI. We present optical reflectance data through ~100 nm of remaining backside Si on functional 22 nm CMOS IC parts with lateral resolution approaching 100 nm. We then discuss potential methods for using NSOM in practical backside fault isolation applications and for improving signal-to-noise ratio (SNR).

Electromagnetic Simulation Optimizes Design of a Sub-20 nm Resolution Optical Microscope

2006 ◽  
Vol 14 (5) ◽  
pp. 28-31
Author(s):  
Erik J. Sanchez
Keyword(s):  
Light Microscopy ◽  
Spatial Resolution ◽  
Near Field ◽  
Optical Microscope ◽  
Diffraction Limit ◽  
Electromagnetic Simulation ◽  
Fundamental Limit ◽  
Scanning Optical Microscopy ◽  
20 Nm ◽  
Near Field Scanning

Recent advances in nanotechnology and nanoscience are highly dependent on our newly acquired ability to measure and manipulate individual structures on the nanoscale. A drawback of light microscopy is the fundamental limit of the attainable spatial resolution dictated by the laws of diffraction at about 250 nanometers. This diffraction limit arises from the fact that it is impossible to focus light to a spot smaller than half its wavelength. The challenge of breaking this limit has led to the development of near-field scanning optical microscopy (NSOM).

scholarly journals Cell biology beyond the diffraction limit: near-field scanning optical microscopy

2001 ◽  
Vol 114 (23) ◽  
pp. 4153-4160
Author(s):  
Frank de Lange ◽  
Alessandra Cambi ◽  
Richard Huijbens ◽  
Bärbel de Bakker ◽  
Wouter Rensen ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Single Molecule ◽  
Cell Biology ◽  
Imaging Techniques ◽  
Near Field ◽  
Diffraction Limit ◽  
Detection Sensitivity ◽  
Live Cells ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Throughout the years, fluorescence microscopy has proven to be an extremely versatile tool for cell biologists to study live cells. Its high sensitivity and non-invasiveness, together with the ever-growing spectrum of sophisticated fluorescent indicators, ensure that it will continue to have a prominent role in the future. A drawback of light microscopy is the fundamental limit of the attainable spatial resolution – ∼250 nm – dictated by the laws of diffraction. The challenge to break this diffraction limit has led to the development of several novel imaging techniques. One of them, near-field scanning optical microscopy (NSOM), allows fluorescence imaging at a resolution of only a few tens of nanometers and, because of the extremely small near-field excitation volume, reduces background fluorescence from the cytoplasm to the extent that single-molecule detection sensitivity becomes within reach. NSOM allows detection of individual fluorescent proteins as part of multimolecular complexes on the surface of fixed cells, and similar results should be achievable under physiological conditions in the near future.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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