Electronic properties of epitaxial cerium oxide films during controlled reduction and oxidation studied by resonant inelastic X-ray scattering
2016 ◽
Vol 18
(30)
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pp. 20511-20517
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Keyword(s):
X Ray
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We investigated the evolution of the electronic structure of cerium oxide ultrathin epitaxial films during reduction and oxidation processes using resonant inelastic X-ray scattering at the Ce L3 absorption edge.
2021 ◽
Vol 143
(12)
◽
pp. 4569-4584
2014 ◽
Vol 118
(46)
◽
pp. 13142-13150
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2004 ◽
Vol 137-140
◽
pp. 487-489
2014 ◽
Vol 53
(5S1)
◽
pp. 05FH07
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