Diffusion layer formation drives zone migration in travelling wave electrophoresis

The Analyst ◽  
2017 ◽  
Vol 142 (9) ◽  
pp. 1554-1561 ◽  
Author(s):  
William Albert Booth ◽  
Boyd Edwards ◽  
Kyoo Jo ◽  
Aaron Timperman ◽  
Jarrod Schiffbauer
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Diffusion Layer ◽  
Traveling Wave ◽  
Travelling Wave ◽  
Layer Formation ◽  
Sample Concentration ◽  
Element Modeling ◽  
Modeling Software ◽  
Microfluidic Separations

COMSOL finite element modeling software is used to simulate 2D traveling-wave electrophoresis for microfluidic separations and sample concentration.

scholarly journals Circular test structures for determining the specific contact resistance of ohmic contacts

2017 ◽  
Vol 30 (3) ◽  
pp. 313-326 ◽  
Author(s):  
Anthony Holland ◽  
Yue Pan ◽  
Mohammad Alnassar ◽  
Stanley Luong
Keyword(s):  
Finite Element ◽  
Contact Resistance ◽  
Finite Element Modeling ◽  
Ohmic Contact ◽  
Ohmic Contacts ◽  
Specific Contact Resistance ◽  
Wave Mechanics ◽  
Element Modeling ◽  
Specific Contact ◽  
Modeling Software

Though the transport of charge carriers across a metal-semiconductor ohmic interface is a complex process in the realm of electron wave mechanics, such an interface is practically characterised by its specific contact resistance. Error correction has been a major concern in regard to specific contact resistance test structures and investigations by finite element modeling demonstrate that test structures utilising circular contacts can be more reliable than those designed to have square shaped contacts as test contacts become necessarily smaller. Finite element modeling software NASTRAN can be used effectively for designing and modeling ohmic contact test structures and can be used to show that circular contacts are efficient in minimising error in determining specific contact resistance from such test structures. Full semiconductor modeling software is expensive and for ohmic contact investigations is not required when the approach used is to investigate test structures considering the ohmic interface as effectively resistive.

Exact First Order Finite Element Modeling for Eddy Current NDE

1991 ◽  
Vol 3 (1) ◽  
pp. 235-253 ◽  
Author(s):  
L. D. Philipp ◽  
Q. H. Nguyen ◽  
D. D. Derkacht ◽  
D. J. Lynch ◽  
A. Mahmood
Keyword(s):  
Finite Element ◽  
Finite Element Modeling ◽  
Eddy Current ◽  
Element Modeling ◽  
First Order ◽  
Eddy Current Nde
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