Local zincblende coordination in heteroepitaxial wurtzite Zn1−xMgxO:Mn thin films with 0.01 ≤ x ≤ 0.04 identified by electron paramagnetic resonance

2015 ◽  
Vol 3 (45) ◽  
pp. 11918-11929 ◽  
Author(s):  
Rolf Böttcher ◽  
Michael Lorenz ◽  
Andreas Pöppl ◽  
Daniel Spemann ◽  
Marius Grundmann
Keyword(s):  
Thin Films ◽  
Electron Paramagnetic Resonance ◽  
Stacking Faults ◽  
Paramagnetic Resonance ◽  
Electron Paramagnetic

Heteroepitaxial Zn1−xMgxO:Mn thin films show already atx= 0.01 a local cubic zincblende coordination attributed to stacking faults.

Identification of intra-grain and grain boundary defects in polycrystalline Si thin films by electron paramagnetic resonance

2013 ◽  
Vol 7 (11) ◽  
pp. 959-962 ◽  
Author(s):  
Tobias Sontheimer ◽  
Alexander Schnegg ◽  
Simon Steffens ◽  
Florian Ruske ◽  
Daniel Amkreutz ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Paramagnetic Resonance ◽  
Grain Boundary ◽  
Paramagnetic Resonance ◽  
Electron Paramagnetic

scholarly journals Local lattice distortions in oxygen deficient Mn-doped ZnO thin films, probed by electron paramagnetic resonance

2014 ◽  
Vol 2 (25) ◽  
pp. 4947 ◽  
Author(s):  
Michael Lorenz ◽  
Rolf Böttcher ◽  
Stefan Friedländer ◽  
Andreas Pöppl ◽  
Daniel Spemann ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Paramagnetic Resonance ◽  
Zno Thin Films ◽  
Paramagnetic Resonance ◽  
Local Lattice ◽  
Lattice Distortions ◽  
Doped Zno ◽  
Electron Paramagnetic ◽  
Mn Doped

Electron paramagnetic resonance investigation on Zn1-x Mn x O thin films grown by MBE

2008 ◽  
Vol 246 (1) ◽  
pp. 237-240 ◽  
Author(s):  
Christoph Knies ◽  
Jan Stehr ◽  
Detlev M. Hofmann ◽  
Wei Xu ◽  
Yingxue Zhou ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Paramagnetic Resonance ◽  
Paramagnetic Resonance ◽  
Resonance Investigation ◽  
Electron Paramagnetic Resonance Investigation ◽  
Electron Paramagnetic

Electron Paramagnetic Resonance in Semiconductors

1980 ◽  
Vol 2 ◽  
Author(s):  
James W. Corbett ◽  
Richard L. Kleinhenz ◽  
Neal D. Wilsey
Keyword(s):  
Heat Treatment ◽  
Electron Paramagnetic Resonance ◽  
High Temperatures ◽  
Point Defects ◽  
Stacking Faults ◽  
Group Iv ◽  
Paramagnetic Resonance ◽  
Future Studies ◽  
Defects In Semiconductors ◽  
Electron Paramagnetic

ABSTRACTThe use of electron paramagnetic resonance (EPR) in the study of defects in semiconductors is briefly reviewed, including group IV (C-diamond, Si, Ge, SiC), III-V (AlSb, GaAs, GaSb, GaP, InAs, InP, InSb), II-VI (BaO, BaS, BeO, CaO, CaS, CaSe, CdO, CdS, CdSe, CdTe, MgO, SrO, SrS, ZnO, ZnS, ZnSe, ZnTe) and miscellaneous svstems. The identification of defects via EPR is described as is the exploitation of that identification as a tool in future studies. Particular attention is paid to Si, where is emerging an integrated panorama of identified defects ranging from point defects to aggregates through intermediate defect configurations (as discussed by Tan) to dislocations and stacking faults; EPR results in Si as a testing ground for the theory of shallow donors, in the understanding of diffusion at high temperatures and in the study of heat-treatment defects are discussed as examples of the use of EPR as a tool in defect studies.

Dominant defect levels in diamond thin films: A photocurrent and electron paramagnetic resonance study

1998 ◽  
Vol 72 (25) ◽  
pp. 3306-3308 ◽  
Author(s):  
M. Nesládek ◽  
L. M. Stals ◽  
A. Stesmans ◽  
K. Iakoubovskij ◽  
G. J Adriaenssens ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Paramagnetic Resonance ◽  
Electron Paramagnetic Resonance Study ◽  
Paramagnetic Resonance ◽  
Defect Levels ◽  
Diamond Thin Films ◽  
Electron Paramagnetic

Electron‐paramagnetic‐resonance investigation of SrS:Ce powders and thin films

1996 ◽  
Vol 80 (9) ◽  
pp. 5218-5222 ◽  
Author(s):  
J. Kreissl ◽  
B. Hüttl ◽  
U. Troppenz ◽  
K.‐O. Velthaus ◽  
R. H. Mauch ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Paramagnetic Resonance ◽  
Paramagnetic Resonance ◽  
Resonance Investigation ◽  
Electron Paramagnetic Resonance Investigation ◽  
Electron Paramagnetic
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